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Xin Hu 0007

dblp:13/6380-7 · DBLP profile ↗
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3ranked-venue papers
2as first author
0since 2021 · last 2007
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 2 first-authorSoftware engineering, systems software and programming languages · 2 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 1 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › electromagnetic simulation
full-wave analysis		 0.112005
Analysis of full-wave conductor system impedance over substrate using novel integration techniques · DAC 2005

Methods — techniques the papers use, named apart from their topics

volume and surface integration · 0.1mixed potential integral equation · 0.1layered media green's functions · 0.1
YearPublicationVenuePosition
2007 Optimization-based wideband basis functions for efficient interconnect extraction
Xin Hu 0007, Tarek Moselhy, Jacob K. White 0001, Luca Daniel
 DATE1
2007 pFFT in FastMaxwell: a fast impedance extraction solver for 3D conductor structures over substrate
Tarek Moselhy, Xin Hu 0007, Luca Daniel
 DATE2
2005 Analysis of full-wave conductor system impedance over substrate using novel integration techniques
abstract
An efficient approach to full-wave impedance extraction is developed that accounts for substrate effects through the use of two-layer media Green's functions in a mixed-potential-integral-equation (MPIE) solver. Particularly, the choice of implementation for the layered media Green's functions motivates the development of accelerated techniques for both volume and surface integrations in the solver. Solver accuracy is validated against measurements taken on fabricated devices; solver efficiency is demonstrated by its 9.8X reduction in cost in comparison to the traditional integration approach.
Xin Hu 0007, Jacob K. White 0001, Luca Daniel
 DAC1