Demo Data from EDBT 2026 / reviewers in the wild / expert
Linfeng Chen
dblp:133/4194
· DBLP profile ↗
7ranked-venue papers
3as first author
3since 2021 · last 2026
—ORCID · conflict
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 3 · 1 since 2021Systems, architecture and hardware · 2 · 2 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1 · 1 since 2021Human-computer interaction and ubiquitous computing · 1 · 1 first-author · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Human-computer interaction and pervasive computing
1 paper |
Immersive interaction · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% | |
| Theoretical computer science
1 paper |
Distributed computing theory · 100% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Immersive interaction
augmented reality interaction |
0.5 | 1 | 2021 | PinpointFly: An Egocentric Position-control Drone Interface using Mobile AR · CHI 2021 |
Immersive interaction › augmented reality
mobile augmented reality interaction |
0.5 | 1 | 2021 | PinpointFly: An Egocentric Position-control Drone Interface using Mobile AR · CHI 2021 |
Electronic design automation › hardware verification and test › test generation
compact test sets |
0.2 | 1 | 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction · IEEE Trans. Computers 2015 |
Electronic design automation › hardware verification and test
design for testability |
0.2 | 1 | 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction · IEEE Trans. Computers 2015 |
Electronic design automation › hardware verification and test
test application time reduction |
0.2 | 1 | 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction · IEEE Trans. Computers 2015 |
Electronic design automation › hardware verification and test
test generation |
0.2 | 1 | 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction · IEEE Trans. Computers 2015 |
Distributed computing theory
distributed graph coloring |
0.1 | 1 | 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction · IEEE Trans. Computers 2015 |
Methods — techniques the papers use, named apart from their topics
user study · 0.5prototype · 0.5vertex coloring · 0.4probabilistic analysis · 0.4
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2026 | An intelligent multimodal fusion paradigm for automated teacher classroom performance evaluation: a pilot study
Bo Sheng, Linfeng Chen, Yujiao Qiao |
Expert Syst. Appl. | 3 |
| 2023 | Keyframe extraction for motion capture data via pose saliency and reconstruction error
Yungen Liu, Linfeng Chen, Zhenrong Lin |
Vis. Comput. | 2 |
| 2021 | PinpointFly: An Egocentric Position-control Drone Interface using Mobile ARabstractAccurate drone positioning is challenging because pilots only have a limited position and direction perception of a flying drone from their perspective. This makes conventional joystick-based speed control inaccurate and more complicated and significantly degrades piloting performance. We propose PinpointFly, an egocentric drone interface that allows pilots to arbitrarily position and rotate a drone using position-control direct interactions on a see-through mobile AR where the drone position and direction are visualized with a virtual cast shadow (i.e., the drone’s orthogonal projection onto the floor). Pilots can point to the next position or draw the drone’s flight trajectory by manipulating the virtual cast shadow and the direction/height slider bar on the touchscreen. We design and implement a prototype of PinpointFly for indoor and visual line of sight scenarios, which are comprised of real-time and predefined motion-control techniques. We conduct two user studies with simple positioning and inspection tasks. Our results demonstrate that PinpointFly makes the drone positioning and inspection operations faster, more accurate, simpler and fewer workload than a conventional joystick interface with a speed-control method. Linfeng Chen, Kazuki Takashima, Kazuyuki Fujita, Yoshifumi Kitamura |
CHI | 1 |
| 2020 | Quantum-inspired ant lion optimized hybrid k-means for cluster analysis and intrusion detection
Xuemei Qi, Linfeng Chen, Fulong Chen 0002, Guihua Cheng |
Knowl. Based Syst. | 3 |
| 2019 | Quantum-inspired cuckoo co-search algorithm for no-wait flow shop scheduling
Haihong Zhu, Xuemei Qi, Fulong Chen 0002, Xin He 0017, Linfeng Chen |
Appl. Intell. | 5 |
| 2015 | Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time ReductionabstractScan tree architecture has been proposed to reduce the test application time of full scan chain by placing multiple scan cells in parallel. Most existing techniques rely on non-compact test pattern sets to construct the scan tree. However, they produce inefficient scan tree when highly compact test sets with few don't cares are used. In this paper, the depth of the scan tree based on approximate compatibility relation for completely specified test data set is analyzed probabilistically by modeling its construction as a vertex coloring problem. The upper bound of edges-per-vertex is computed and demonstrated to be a prime factor that limits the efficiency of scan tree construction based on both compatible and approximately compatible test data between two flip-flops. Inverse compatibility and aggressive approximate compatibility are then proposed to increase the edges-per-vertex for vertex coloring. The Q'-SD connection between two adjacent scan cells is exploited to implement the inverse compatibility with no cost or timing impact. To maintain the fault coverage, the missing faults under the tree scan mode can be detected by switching the same base architecture into the linear scan mode with negligible hardware overhead as shown by the experimental results on ISCAS89, ISCAS99 and LGSynth93 benchmark circuits. On average, the scan tree generated by our method reduces the test time of the full scan chain by 56.65 percent, and that of the scan tree designed by the approximate compatibility method by 39.18 percent under the same compact test sets. Linfeng Chen, Aijiao Cui, Chip-Hong Chang |
IEEE Trans. Computers | 1 |
| 2013 | A power-efficient scan tree design by exploring the Q'-D connectionabstractFull scan design is usually time-consuming. Scan tree-based architectures can be applied to reduce test time, but few of them are power-efficient. Many low-power techniques have been proposed for scan chain design, while they are not applicable to scan tree architecture. To achieve a time-efficient and low-power scan design, in this paper, we propose a scheme to reduce the test power consumption of scan tree design by exploiting the Q' ports of scan flip-flops. As the structure of scan tree is not affected, the scheme resembles the time-efficiency of scan tree design. The modification for low power maintains the order of scan cells. It thus avoids the consequent design overhead due to scan reordering. Furthermore, no extra hardware is introduced. Experimental results on ISCAS'89 benchmarks show that 8.38% weighted transitions during test application can be reduced on average. Linfeng Chen, Aijiao Cui |
ISCAS | 1 |