Demo Data from EDBT 2026 / reviewers in the wild / expert
Karl Moody
dblp:139/2476
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2013
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.1 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › timing analysis
static timing analysis |
0.1 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › timing analysis
transistor-level timing analysis |
0.1 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › physical verification
electrical rule checking |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › physical design
parasitic extraction |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation
physical design |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Methods — techniques the papers use, named apart from their topics
transistor width tuning · 0.1static noise analysis · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2013 | Efficient PVT independent abstraction of large IP blocks for hierarchical power analysisabstractWe introduce a generalized, efficient, and accurate power abstraction model and generation techniques for complex IP blocks. This is based on the contributor based power modeling concept, which exploits the nature of power consuming components in a design being inherently separable. The generated power abstraction is Process, Voltage and Temperature (PVT) independent, thus enabling very efficient hierarchical power analysis. Our approach constitutes the industry's first design methodology to automatically generate PVT independent contributor based abstracts. We also describe extensions to the power contributor concept to model dynamic power. Extensive analysis and results on real industry designs to study the accuracy impacts of abstraction as a function of design types and sizes are presented. We also present model to hardware correlation experiments demonstrating the application of this abstraction based methodology on the IBM Power7+ server microprocessor chip. Nagu R. Dhanwada, David J. Hathaway, Victor V. Zyuban, Karl Moody, William W. Dungan, Rahul M. Rao, Christopher J. Gonzalez |
ICCAD | 5 |
| 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBMabstractIBM's high-performance microprocessor designs leverage internally developed electronic design automation tools to create high-frequency, power efficient, and robust microprocessors. This paper describes some of the tools employed in the custom circuit design methodology in IBM. The tools described include a transistor-level block-based static timer, a static noise analysis methodology, and a transistor width tuner that optimizes performance and area. We also describe the application of electrical rule checking used to enforce consistent design practices. Finally, we discuss a macro extraction tool that determines parasitic resistance and capacitance of interconnect from a layout. Karen Bard, Bill Dewey, Mei-Ting Hsu, Tom Mitchell 0003, Karl Moody, Vasant Rao, Ron Rose, Jeff Soreff, Steve Washburn |
Proc. IEEE | 5 |