Demo Data from EDBT 2026 / reviewers in the wild / expert
Shigeo Nakamura
dblp:14/2713
· DBLP profile ↗
6ranked-venue papers
0as first author
1since 2021 · last 2023
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3Artificial intelligence and machine learning · 1Databases, data management, data science and information retrieval · 1Graphics, computer vision, multimedia, augmented reality and games · 1Applied, interdisciplinary, general and emerging computing · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Medical and health informatics · 50% Bioinformatics and computational biology · 50% | |
| Artificial intelligence
1 paper |
Learning paradigms · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Machine learning › Learning paradigms
multiple instance learning |
0.4 | 1 | 2020 | Multi-scale Domain-adversarial Multiple-instance CNN for Cancer Subtype Classification with Unannotated Histopathological Images · CVPR 2020 |
Bioinformatics and computational biology › cancer genomics › cancer subtype analysis
cancer subtype classification |
0.4 | 1 | 2020 | Multi-scale Domain-adversarial Multiple-instance CNN for Cancer Subtype Classification with Unannotated Histopathological Images · CVPR 2020 |
Medical and health informatics
computational pathology |
0.4 | 1 | 2020 | Multi-scale Domain-adversarial Multiple-instance CNN for Cancer Subtype Classification with Unannotated Histopathological Images · CVPR 2020 |
Electronic design automation › hardware verification and test › design for testability
built-in self-test |
0.0 | 1 | 1996 | Aliasing Error for a Mask ROM Built-In Self-Test · IEEE Trans. Computers 1996 |
Electronic design automation › hardware verification and test
fault analysis |
0.0 | 1 | 1996 | Aliasing Error for a Mask ROM Built-In Self-Test · IEEE Trans. Computers 1996 |
Methods — techniques the papers use, named apart from their topics
multi-scale CNN · 0.9domain adversarial learning · 0.9experimental fault survey · 0.0aliasing probability analysis · 0.0MISR implementation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2023 | Case-based similar image retrieval for weakly annotated large histopathological images of malignant lymphoma using deep metric learningabstractIn the present study, we propose a novel case-based similar image retrieval (SIR) method for hematoxylin and eosin (H&E) stained histopathological images of malignant lymphoma. When a whole slide image (WSI) is used as an input query, it is desirable to be able to retrieve similar cases by focusing on image patches in pathologically important regions such as tumor cells. To address this problem, we employ attention-based multiple instance learning, which enables us to focus on tumor-specific regions when the similarity between cases is computed. Moreover, we employ contrastive distance metric learning to incorporate immunohistochemical (IHC) staining patterns as useful supervised information for defining appropriate similarity between heterogeneous malignant lymphoma cases. In the experiment with 249 malignant lymphoma patients, we confirmed that the proposed method exhibited higher evaluation measures than the baseline case-based SIR methods. Furthermore, the subjective evaluation by pathologists revealed that our similarity measure using IHC staining patterns is appropriate for representing the similarity of H&E stained tissue images for malignant lymphoma. Noriaki Hashimoto, Yusuke Takagi, Hiroki Masuda, Hiroaki Miyoshi, Kei Kohno, Miharu Nagaishi, Kensaku Sato, Mai Takeuchi, Takuya Furuta, Keisuke Kawamoto, Kyohei Yamada, Mayuko Moritsubo, Kanako Inoue, Yasumasa Shimasaki, Yusuke Ogura, Teppei Imamoto, Tatsuzo Mishina, Ken Tanaka, Yoshino Kawaguchi, Shigeo Nakamura, Koichi Ohshima, Hidekata Hontani, Ichiro Takeuchi |
Medical Image Anal. | 20 |
| 2020 | Multi-scale Domain-adversarial Multiple-instance CNN for Cancer Subtype Classification with Unannotated Histopathological ImagesabstractWe propose a new method for cancer subtype classification from histopathological images, which can automatically detect tumor-specific features in a given whole slide image (WSI). The cancer subtype should be classified by referring to a WSI, i.e., a large-sized image (typically 40,000x40,000 pixels) of an entire pathological tissue slide, which consists of cancer and non-cancer portions. One difficulty arises from the high cost associated with annotating tumor regions in WSIs. Furthermore, both global and local image features must be extracted from the WSI by changing the magnifications of the image. In addition, the image features should be stably detected against the differences of staining conditions among the hospitals/specimens. In this paper, we develop a new CNN-based cancer subtype classification method by effectively combining multiple-instance, domain adversarial, and multi-scale learning frameworks in order to overcome these practical difficulties. When the proposed method was applied to malignant lymphoma subtype classifications of 196 cases collected from multiple hospitals, the classification performance was significantly better than the standard CNN or other conventional methods, and the accuracy compared favorably with that of standard pathologists. Noriaki Hashimoto, Daisuke Fukushima, Ryoichi Koga, Yusuke Takagi, Kaho Ko, Kei Kohno, Masato Nakaguro, Shigeo Nakamura, Hidekata Hontani, Ichiro Takeuchi |
CVPR | 8 |
| 2005 | Development of an artificial market model based on a field study
Kiyoshi Izumi, Shigeo Nakamura, Kazuhiro Ueda |
Inf. Sci. | 2 |
| 1997 | Experimental fault analysis of 1 Mb SRAM chipsabstractAnalyzing 1,000 faulty 1 Mb SRAM chips that were randomly selected from a single manufacture, we found 251 stuck-at cell faults, 5 stuck-at bit-line faults, 1 stuck-at word-line fault, 46 neighborhood-pattern-sensitive faults, and other kinds of faults. Under the condition that I/sub dd/=4.5 I; temperature=70/spl deg/C, and load capacity C/sub L/=30 pF, we detected margin faults in 460 chips. Because the actual fault data for SRAM chips is rarely reported, the data in this manuscript are very useful and should be of practical importance. Hiroyuki Goto, Shigeo Nakamura, Kazuhiko Iwasaki |
VTS | 2 |
| 1996 | Aliasing Error for a Mask ROM Built-In Self-TestabstractTo develop better ROM BIST techniques we first experimentally surveyed cell faults, word-line faults, bit-line faults, delay faults and other types of faults occurring in 1,000 faulty mask ROM chips. We found that most of the stuck-at faults were within a single mat. We then theoretically analyzed the aliasing probability for a mask ROM containing a fault or faults within a single mat. To experimentally evaluate BIST aliasing errors we implemented six MISRs on a custom board and observed actual aliasing errors. The experimentally measured aliasing probabilities agreed with the probabilities derived theoretically. No aliasing error occurred for the 16-stage, 8-input MISR. Kazuhiko Iwasaki, Shigeo Nakamura |
IEEE Trans. Computers | 2 |
| 1994 | Aliasing error for a mask ROM built-in self-testabstractThe aliasing probability is theoretically analyzed for a mask ROM containing a word/bit-line fault or faults within a mat. Analysis of 1000 faulty mask ROM chips revealed cell faults, word-line faults, bit-line faults, delay faults and other types. For these chips, the BIST aliasing errors were experimentally examined. Six MISRs were implemented on a custom board, and aliasing errors were actually observed. The best of the six is shown to be the 16-stage, 8-input MISR with no aliasing error.> Kazuhiko Iwasaki, Akinori Furuta, Shigeo Nakamura |
VTS | 3 |