EDBT 2026 Demo / reviewers in the wild / expert
Chi-Chang Liaw
dblp:14/6902
· DBLP profile ↗
3ranked-venue papers
2as first author
0since 2021 · last 1984
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 100% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
high-level synthesis |
0.0 | 1 | 1984 | A high level synthesis tool for MOS chip design · DAC 1984 |
Electronic design automation › hardware verification and test
fault testing |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Electronic design automation › hardware verification and test › fault testing
intermittent fault testing |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Electronic design automation › hardware verification and test
sequential circuit testing |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Electronic design automation › hardware verification and test
test generation |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Electronic design automation › hardware verification and test › fault diagnosis
intermittent faults |
0.0 | 1 | 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits · IEEE Trans. Computers 1981 |
Methods — techniques the papers use, named apart from their topics
test-experiment design · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1984 | A high level synthesis tool for MOS chip design
Jean-Pierre Dussault, Chi-Chang Liaw, Michael M. Tong |
DAC | 2 |
| 1981 | State Diagram Approach for Functional Testing of Control Section
Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya |
ITC | 1 |
| 1981 | Test-Experiments for Detection and Location of Intermittent Faults in Sequential CircuitsabstractPractical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits. Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya |
IEEE Trans. Computers | 1 |