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Tetsuhiko Ikegami

dblp:142/0847 · DBLP profile ↗
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3ranked-venue papers
2as first author
0since 2021 · last 1992
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 2 · 1 first-authorApplied, interdisciplinary, general and emerging computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer networks
3 papers
Optical networks · 78% Routing and switching · 14% Internet architecture and protocols · 8%
Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 100%

Topics — the 7 heaviest of 9, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Optical networks
all-optical networks
0.011992
Survey of telecommunications applications of quantum electronics-progress with optical fiber communications · Proc. IEEE 1992
Optical networks
optical fiber communication
0.011992
Survey of telecommunications applications of quantum electronics-progress with optical fiber communications · Proc. IEEE 1992
Optical networks › optical switching
photonic switching
0.011988
Semiconductor devices in photonic switching · IEEE J. Sel. Areas Commun. 1988
Routing and switching › switching networks
space-division switching
0.011988
Semiconductor devices in photonic switching · IEEE J. Sel. Areas Commun. 1988
Internet architecture and protocols › ISDN
broadband ISDN
0.011992
Survey of telecommunications applications of quantum electronics-progress with optical fiber communications · Proc. IEEE 1992
Optical networks
optical amplifier
0.011992
Survey of telecommunications applications of quantum electronics-progress with optical fiber communications · Proc. IEEE 1992
Optical networks › optical switch
optical switch array
0.011988
Semiconductor devices in photonic switching · IEEE J. Sel. Areas Commun. 1988

Methods — techniques the papers use, named apart from their topics

statistical reliability analysis · 0.0aging test · 0.0
YearPublicationVenuePosition
1992 Survey of telecommunications applications of quantum electronics-progress with optical fiber communications
abstract
Optical transmission for high data rate telecommunications constitutes one of the most important applications of quantum electronics. The author describes the rapid development of this technology, the state of the art, and some projections for the future. In particular, the characteristics of the fiber transmission medium, the semiconductor laser sources, and the receivers are described along with the recent advances made possible by the development of practical optical amplifiers. The main challenges for the future are in development of practical broadband integrated-services digital networks and components for an all-photonic network.>
Tetsuhiko Ikegami
Proc. IEEE1
1988 Semiconductor devices in photonic switching
abstract
Three types of photonic switching networks have been proposed, namely, optical space-division switching, optical wavelength-division switching. Optional function devices required for each switching network are as follows: optical switch matrix for space-division switching; optical memory and optical write/read gate for time-division switching; and tunable wavelength filter and wavelength converter for wavelength-division switching. Recent progress in semiconductor functional devices such as modulators, switching devices, bistable devices, and wavelength control devices, which would be key devices to build switching networks, is reviewed.>
Tetsuhiko Ikegami, Hitoshi Kawaguchi
IEEE J. Sel. Areas Commun.1
1984 Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems
abstract
This paper reports the strategy for establishing the reliability assurance for LD's and APD's available for undersea transmission systems. On the basis of aging data during more than 104h and a statistical analysis for the reliability of semiconductor devices, the LD's and Ge-APD's lifetest plans for high reliability assurance are proposed.
Yoshinori Nakano, Hiromi Sudo, Genzo Iwane, Tetsuhiko Ikegami
IEEE J. Sel. Areas Commun.5