Demo Data from EDBT 2026 / reviewers in the wild / expert
Supreet Jeloka
dblp:145/9210
· DBLP profile ↗
7ranked-venue papers
2as first author
0since 2021 · last 2019
0000-0002-8477-4745ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 7 · 2 first-authorApplied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
6 papers |
Memory systems · 31% Hardware reliability and fault tolerance · 20% Interconnection networks and networks-on-chip · 16% |
Topics — the 18 heaviest of 18, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Interconnection networks and networks-on-chip › switch architecture
high-radix switch |
0.4 | 2 | 2014 | Hi-Rise: A High-Radix Switch for 3D Integration with Single-Cycle Arbitration · MICRO 2014 Quality-of-Service for a High-Radix Switch · DAC 2014 |
Memory systems
cache design |
0.3 | 1 | 2017 | Compute Caches · HPCA 2017 |
Memory systems › processing-in-memory › computing-in-memory › in-SRAM computing
in-cache computing |
0.3 | 1 | 2017 | Compute Caches · HPCA 2017 |
Memory systems
processing-in-memory |
0.3 | 1 | 2017 | Compute Caches · HPCA 2017 |
Hardware reliability and fault tolerance › error-correcting codes for memory
chipkill correct |
0.2 | 1 | 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems · IEEE Trans. Computers 2016 |
Memory systems
DRAM |
0.2 | 1 | 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems · IEEE Trans. Computers 2016 |
Hardware reliability and fault tolerance › memory reliability
DRAM reliability |
0.2 | 1 | 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems · IEEE Trans. Computers 2016 |
Storage systems › storage reliability
erasure coding |
0.2 | 1 | 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems · IEEE Trans. Computers 2016 |
Hardware reliability and fault tolerance › error correction
error-correcting codes |
0.2 | 1 | 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems · IEEE Trans. Computers 2016 |
Energy-efficient computing › voltage scaling
near-threshold computing |
0.2 | 1 | 2016 | Near-threshold computing in FinFET technologies: opportunities for improved voltage scalability · DAC 2016 |
Energy-efficient computing
voltage scaling |
0.2 | 1 | 2016 | Near-threshold computing in FinFET technologies: opportunities for improved voltage scalability · DAC 2016 |
Integrated circuit design
3d integration |
0.2 | 1 | 2014 | Hi-Rise: A High-Radix Switch for 3D Integration with Single-Cycle Arbitration · MICRO 2014 |
Interconnection networks and networks-on-chip
arbitration |
0.2 | 1 | 2014 | Hi-Rise: A High-Radix Switch for 3D Integration with Single-Cycle Arbitration · MICRO 2014 |
Cloud and datacenter computing
quality of service |
0.2 | 1 | 2014 | Quality-of-Service for a High-Radix Switch · DAC 2014 |
Memory systems
in-memory computing |
0.1 | 1 | 2017 | Compute Caches · HPCA 2017 |
Integrated circuit design
digital circuit design |
0.1 | 1 | 2016 | Near-threshold computing in FinFET technologies: opportunities for improved voltage scalability · DAC 2016 |
Integrated circuit design
system-on-chip |
0.1 | 1 | 2014 | Quality-of-Service for a High-Radix Switch · DAC 2014 |
Interconnection networks and networks-on-chip › virtual channels
virtual channel allocation |
0.1 | 1 | 2014 | VIX: Virtual Input Crossbar for Efficient Switch Allocation · DAC 2014 |
Methods — techniques the papers use, named apart from their topics
vector computation · 0.3bit-line SRAM circuit · 0.3workload evaluation · 0.2synthesis · 0.2FinFET technology · 0.2traffic regulation · 0.2separable allocator design · 0.2high-radix switching · 0.23d integration · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | A 65nm switched source line sub-threshold ROM using data encoding, with 0.3V Vmin and 47fJ/b access energyabstractBattery-operated sensing systems have very low activity rates and power down most blocks during inactive periods to save power. During active periods, these energy-constrained systems typically operate at near or sub-threshold voltage for maintaining energy efficiency. Therefore, these ultra-low energy systems require a read-only, non-volatile code memory that can be accessed at sub-threshold voltage. ROM is the most energy efficient read-only non-volatile memory. A conventional compiler ROM cannot work reliably in near threshold regions of operation due to lack of read margin. As a result, for energy constrained IoT systems, the ROM design needs to support reliable read at low operating voltages, and a speed degradation at low voltages which is at par with logic circuits, to avoid the ROM from limiting the system performance. This paper proposes a sub-threshold ROM that addresses both reliability and performance issues by 1) Using a switched source-line (SSL) to nullify Ioff and improve read margin, 2) Compensating performance degradation caused by SSL using a novel data encoding scheme and by using unused `0' bit-cell transistors to provide local pull-down paths, 3) Tackle variation-based performance degradation by optimizing bit-cell sizing for sub-threshold, and 4) Providing a fine-grained threshold voltage adjustment technique for trading off performance improvement with leakage degradation by using a novel INverse Width Effect (INWE) bit-cell layout. The proposed SSL sub-threshold ROM is fabricated in 65nm technology, with an 8kB capacity, and a Vminof 0.3V. At 0.4V, it has a read speed of 1.1MHz and an access energy of 47fJ/bit. Supreet Jeloka, Pranay Prabhat, Graham Knight, James Myers |
ISLPED | 1 |
| 2017 | Compute CachesabstractThis paper presents the Compute Cache architecture that enables in-place computation in caches. Compute Caches uses emerging bit-line SRAM circuit technology to re-purpose existing cache elements and transforms them into active very large vector computational units. Also, it significantly reduces the overheads in moving data between different levels in the cache hierarchy. Solutions to satisfy new constraints imposed by Compute Caches such as operand locality are discussed. Also discussed are simple solutions to problems in integrating them into a conventional cache hierarchy while preserving properties such as coherence, consistency, and reliability. Compute Caches increase performance by 1.9× and reduce energy by 2.4× for a suite of data-centric applications, including text and database query processing, cryptographic kernels, and in-memory checkpointing. Applications with larger fraction of Compute Cache operations could benefit even more, as our micro-benchmarks indicate (54× throughput, 9× dynamic energy savings). Shaizeen Aga, Supreet Jeloka, Arun Subramaniyan 0001, Satish Narayanasamy, David T. Blaauw, Reetuparna Das |
HPCA | 2 |
| 2016 | Near-threshold computing in FinFET technologies: opportunities for improved voltage scalabilityabstractIn recent years, operating at near-threshold supply voltages has been proposed to improve energy efficiency in circuits, yet decreased efficacy of dynamic voltage scaling has been observed in recent planar technologies. However, foundries have introduced a shift from planar to FinFET fabrication processes. In this paper, we study 7nm FinFET's ability to voltage scale and compare it to planar technologies across three dynamic voltage scaling scenarios. The switch to FinFET allows for a return to strong voltage scalability. We find up to 8.6× higher energy efficiency at NT compared to nominal supply voltage (vs. 4.8× gain in 20nm planar). Nathaniel Ross Pinckney, Lucian Shifren, Brian Cline, Saurabh Sinha 0001, Supreet Jeloka, Ronald G. Dreslinski, Trevor N. Mudge, Dennis Sylvester, David T. Blaauw |
DAC | 5 |
| 2016 | Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM SystemsabstractMost server-grade systems provide Chipkill-Correct error protection at the expense of power and performance. In this paper we present a low overhead solution to improving the reliability of commodity DRAM systems with no change in the existing memory architecture. Specifically, we propose five erasure and error correction (E-ECC) schemes that provide at least Chipkill-Correct protection for x4 (Schemes 1, 2 and 3), x8 (Scheme 4) and x16 (Scheme 5) DRAM systems. All schemes have superior error correction performance due to the use of strong symbol-based codes. Synthesis results in 28 nm node show that the decoding latency of these codes is negligible compared to the DRAM access latency. In addition, we make use of erasure codes to extend the lifetime of the DRAM systems. Specifically, once a chip is marked faulty due to persistent errors, all E-ECC schemes correct erasures due to that faulty chip and also correct an additional random error in a second chip. Evaluation with SPEC2006 workloads show that compared to x4 Chipkill-Correct schemes, Scheme 5 has the highest IPC improvement (mean of 7 percent) and Scheme 4 has the largest power reduction (mean of 18 percent) and the largest increase in energy efficiency (mean of 25 percent). Hsing Min Chen, Supreet Jeloka, Akhil Arunkumar, David T. Blaauw, Carole-Jean Wu, Trevor N. Mudge, Chaitali Chakrabarti |
IEEE Trans. Computers | 2 |
| 2014 | Quality-of-Service for a High-Radix SwitchabstractCommunication in multi-processor systems-on-chip requires guaranteed throughput and latency. If the network is unaware of ongoing communication patterns, applications may not receive their necessary bandwidth or may suffer high network latencies. Many techniques have been proposed to provide quality-of-service (QoS) in the network by regulating network traffic; however, as network sizes have increased, the complexity of these techniques has grown as well, particularly in the case of multi-hop networks. Nilmini Abeyratne, Supreet Jeloka, Yiping Kang, David T. Blaauw, Ronald G. Dreslinski, Reetuparna Das, Trevor N. Mudge |
DAC | 2 |
| 2014 | VIX: Virtual Input Crossbar for Efficient Switch AllocationabstractSeparable allocators in on-chip routers perform switch allocation in two stages that often make uncoordinated decisions resulting in sub-optimal switch allocation. We propose Virtual Input Crossbars (VIX), where more than one virtual channel (VC) of an input port is connected to the crossbar. VIX improves switch allocation by allowing more than one input VC of an input port to transmit flits in the same cycle. Also, more input VCs can participate in the output arbitration, reducing the chances of uncoordinated decisions. VIX improves network throughput by more than 15% for the topologies studied without affecting the router critical path. Supriya Rao, Supreet Jeloka, Reetuparna Das, David T. Blaauw, Ronald G. Dreslinski, Trevor N. Mudge |
DAC | 2 |
| 2014 | Hi-Rise: A High-Radix Switch for 3D Integration with Single-Cycle ArbitrationabstractThis paper proposes a novel 3D switch, called 'Hi-Rise', that employs high-radix switches to efficiently route data across multiple stacked layers of dies. The proposed interconnect is hierarchical and composed of two switches per silicon layer and a set of dedicated layer to layer channels. However, a hierarchical 3D switch can lead to unfair arbitration across different layers. To address this, the paper proposes a unique class-based arbitration scheme that is fully integrated into the switching fabric, and is easy to implement. It makes the 3D hierarchical switch's fairness comparable to that of a flat 2D switch with least recently granted arbitration. The 3D switch is evaluated for different radices, number of stacked layers, and different 3D integration technologies. A 64-radix, 128-bit width, 4-layer Hi-Rise evaluated in a 32nm technology has a throughput of 10.65 Tbps for uniform random traffic. Compared to a 2D design this corresponds to a 15% improvement in throughput, a 33% area reduction, a 20% latency reduction, and a 38% energy per transaction reduction. Supreet Jeloka, Reetuparna Das, Ronald G. Dreslinski, Trevor N. Mudge, David T. Blaauw |
MICRO | 1 |