EDBT 2026 Demo / reviewers in the wild / expert
Rossella Brunetti
dblp:145/9301
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1991
0000-0002-0585-4828ORCID · reported
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
device simulation |
0.0 | 1 | 1991 | Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 |
Electronic design automation › technology computer-aided design › device simulation
monte carlo device simulation |
0.0 | 1 | 1991 | Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991 |
Methods — techniques the papers use, named apart from their topics
monte carlo simulation · 0.0impact ionization modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1991 | Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET'sabstractMonte Carlo simulations of high-energy electrons and holes in Si n-MOSFETs are presented. Key features of this work include the use of a suitable silicon model for carrier transport at high electric fields, an original impact ionization model, and sophisticated numerical techniques to speed up the calculation. The case of submicrometer Si n-MOSFETs is considered as a relevant application.> Franco Venturi, Enrico Sangiorgi, Rossella Brunetti, Wolfgang Quade, Carlo Jacoboni, Bruno Riccò |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |