While NAND flash memory has continuously increased its storage density over decades, this progress has exacerbated the read-disturbance problem. In this work, we identify two fundamental limitations of existing read-disturbance management techniques that trigger read reclaim (RR) at the block granularity: (i) they overlook the heterogeneous reliability impact of read disturbance across individual wordlines (WLs), leading to unnecessary RR in many cases; and (ii) they address read disturbance only after disturbance-induced errors have already accumulated, which forces substantial RR-induced copy overheads in read-disturbance-prone modern NAND flash memory. To address these limitations, we propose STRAW (STRess-Aware Wordline-based read-disturbance management), a new technique that minimizes RR overheads through two key ideas: (i) stress-aware WL-based read reclaim, which monitors the accumulated read-disturbance effect on each WL and reclaims only heavily disturbed WLs, and (ii) stress-reduced read, which mitigates disturbance on valid WLs during each read operation by scaling pass-through voltages based on WL validity. Our experimental results using a modern SSD emulator show that STRAW reduces RR-induced page-copy overhead by 88.6% on average compared with the state-of-the-art technique.

Data-centric applications perform tasks that require intensive data processing and ample memory resources. These tasks have varying I/O access patterns, significantly impacted by the OS cache. Therefore, it is desirable to enable application-specific cache management without compromising memory efficiency. However, infusing user-level policies into the OS cache management is challenging because it is difficult to communicate application-level I/O semantics and access patterns to general-purpose OSs. This article addresses the challenge by enabling applications to safely convey their I/O semantics to OSs via eBPF, allowing for more application-specific control over the OS cache. To this end, we introduce P2Cache , a programmable OS page cache. P2Cache extends the Linux page cache with three new probe points (i.e., eviction , prefetching , and swapping ) that can support application-directed custom policies on OS cache management using eBPF programs. Our experimental results showed that P2Cache significantly enhanced the performance of an LLM inference, a graph processing application, and a database by up to 230%, 49%, and 18%, respectively, with minimal effort.

We propose P2Cache, an application-directed kernel-level page cache that allows an application developer to build a custom kernel-level page cache that matches the I/O characteristics of a target application. P2Cache extends a Linux kernel page cache by adding new probe points that are used to support application-programmable kernel page caches by eBPF programs. Our experimental results show that custom page caches implemented with our P2Cache achieve up to 32% performance improvement in data-intensive graph applications with little effort.

We propose a novel whitelist-based anti-ransomware solution called alohomora. Alohomora is based on our observation that an I/O activity of an application can be an effective abstraction level for managing I/O whitelisting. In alohomora, when a write request is sent to an SSD, its program context value (which is supported by a host CPU register) is passed to the SSD. The SSD checks if the request was pre-approved using the program context value, thus preventing ransomware from modifying files in the SSD. Our experimental results using a prototype alohomora system show that alohomora can achieve a strong security level against sophisticated ransomware attacks without degrading I/O performance.

In this paper, a design for debug (DFD) method that reuses test resources is proposed to reduce the debug cost in post-silicon validation. With the proposed method, the trace buffer is shared for embedded cores to capture the signatures of each core concurrently by reusing a test access mechanism. In this case, the depth of the trace buffer allocated to the core is reconfigurable and variable according to debug scheme. The experimental results indicate that the proposed DFD significantly reduces the debug time when the trace buffer is shared by cores in various debug cases.

Semiconductor manufacture companies make an effort to reduce the test time for the test cost reduction until mass production starts. One of the effective test time reduction techniques is to improve the parallel test efficiency with the test program optimization by debugging on the automatic test equipment (ATE). However, given the time constraints of production schedules, the available time for the test program optimization is not enough to debug all test items at all. For this reason, it is important to select cost-effective test items in order to optimize the test program for the test time reduction. In this paper, we introduce the test item priority estimation method for high parallel test efficiency. Experimental results obtained from the actual industrial system-on-chip (SoC) circuits show that our proposed method provides the lower total test time for mass production under the same ATE debug time constraints as the cost-effective solution.

In the post-silicon debug of multicore designs, the debug time has increased significantly because the number of cores undergoing debug has increased; however the resources available to debug the design are limited. This paper proposes a new DRAM-based error detection method to overcome this challenge. The proposed method requires only three debug sessions even if multiple cores are present. The first debug session is used to detect the error intervals of each core using golden signatures. The second session is used to detect the error clock cycles in each core using a golden data stream. Instead of storing all of the golden data, the golden data stream is generated by selecting error-free debug data for each interval which are guaranteed by the first session. Finally, the error data in all cores are only captured during the third session. The experimental results on various debug cases show significant reductions in total debug time and the amount of DRAM usage compared to previous methods.

Debug time has become a major issue in post silicon debug because of the increasingly complicated nature of circuit design. However, reducing debug time is a major challenge because of the limited size of the trace buffer used to observe internal signals in the circuit. This study proposes an on-chip error detection method to overcome this challenge. The on-chip process detects the error-suspect window using the pre-calculated golden data stored in the trace buffer. This allows the selective compaction and capture of the debug data in the trace buffer during the error-containing interval. As a result, reducing the number of debug sessions significantly reduces the total debug time. The experimental results on various debug cases show significant reductions in total debug time compared to previous work.

This paper proposes a new network-on-chip (NoC)-reused test access mechanism (TAM) for testing multiple identical cores. It can test multiple cores concurrently and identify faulty cores to derate the chip by excluding the core. In order to minimize the test time, the TAM utilizes the majority value of test response data. All of the cores can thereby be tested in parallel and test costs (in both test pins and test time) are exactly the same as those for a single core. The hardware overhead is minimized by reusing the NoC infrastructures and transfer-counters are designed as a majority analyzer. The experimental results in this paper show that the proposed TAM can test multiple cores in the same time as a single core and with negligible hardware overhead.

The increased use of multicore chips diminishes per-core complexity and also demands parallel design and test technologies. An especially important evolution of the multicore chip has been the use of multiple identical cores, providing a homogenous system with various merits. This paper introduces a novel test access mechanism (TAM) for parallel testing of multiple identical cores and identifying faulty cores to derate the chip by excluding it. Instead of typical test response data from the cores, the test output data used in this paper are the majority values, that is, the typical test responses from the cores. All the cores can thereby be tested in parallel and test costs (in both test pins and test time) are exactly the same as for a single core. The proposed TAM can be implemented with on-chip comparators and majority analyzers. The experimental results in this paper show that the proposed TAM can test multiple cores with minimal test pins and test time and with hardware overhead of <;0.1%.

This paper proposes a new parallel test access strategy for multiple identical cores in a network-on-chip (NoC). The proposed test strategy takes advantage of the regular design of NoC to reduce both test area overhead and test time. The proposed NoC reused test access mechanism (TAM) adopted a pipelining structure and a deterministic test data routing algorithm in order to reuse the full bandwidth of links in the NoC. Also, the architecture has complete scalability according to the number of cores and applications for 3D environment are also represented. Experimental results show that the proposed TAM can test multiple cores with the same test time as a single core and negligible hardware overhead.