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Jerome Baum

dblp:147/2346 · DBLP profile ↗
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1ranked-venue papers
1as first author
1since 2021 · last 2023
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1 · 1 first-author · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Artificial intelligence
1 paper
Probabilistic and Bayesian machine learning · 91% Deep learning architectures and training · 9%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Machine learning › Probabilistic and Bayesian machine learning › statistical inference
goodness-of-fit testing
0.712023
A Kernel Stein Test of Goodness of Fit for Sequential Models · ICML 2023
Machine learning › Probabilistic and Bayesian machine learning › divergence measure
kernel stein discrepancy
0.712023
A Kernel Stein Test of Goodness of Fit for Sequential Models · ICML 2023
Machine learning › Deep learning architectures and training
sequence modeling
0.212023
A Kernel Stein Test of Goodness of Fit for Sequential Models · ICML 2023

Methods — techniques the papers use, named apart from their topics

stein operator · 0.7kernel stein discrepancy · 0.7
YearPublicationVenuePosition
2023 A Kernel Stein Test of Goodness of Fit for Sequential Models
abstract
We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.
Jerome Baum, Heishiro Kanagawa, Arthur Gretton
ICML1