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Peter B. Griffin

dblp:15/4808 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2001
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor devices › device scaling
MOSFET scaling
0.012001
Material and process limits in silicon VLSI technology · Proc. IEEE 2001
Integrated circuit design › semiconductor technology › semiconductor process technology
silicon technology
0.012001
Material and process limits in silicon VLSI technology · Proc. IEEE 2001
Integrated circuit design › semiconductor technology
semiconductor process technology
0.012001
Material and process limits in silicon VLSI technology · Proc. IEEE 2001
YearPublicationVenuePosition
2001 Material and process limits in silicon VLSI technology
abstract
The integrated circuit (IC) industry has followed a steady path of shrinking device geometries for more than 30 years. It is widely believed that this process will continue for at least another ten years. However there are increasingly difficult materials and technology problems to be solved over the next decade if this is to actually occur, and beyond ten years there is great uncertainty about the ability to continue scaling metal-oxide-semiconductor field-effect transistor (MOSFET) structures. This paper describes some of the the most challenging materials and process issues to be faced in the future and where possible solutions are known, describes these potential solutions. The paper is written with the underlying assumption that the basic metal-oxide-semiconductor (MOS) transistor will remain the dominant switching device used in ICs and it further assumes that silicon will remain the dominant substrate material.
James D. Plummer, Peter B. Griffin
Proc. IEEE2