Texture characterization of natural images using the mathematical framework of multifractal analysis (MFA) enables the study of the fluctuations in the regularity of image intensity. Although successfully applied in various contexts, the use of MFA has so far been limited to the independent analysis of a single image, while the data available in applications are increasingly multivariate. This paper addresses this limitation and proposes a joint Bayesian model and associated estimation procedure for multifractal parameters of multivariate images. It builds on a recently introduced generic statistical model that enabled the Bayesian estimation of multifractal parameters for a single image and relies on the following original key contributions: First, we develop a novel Fourier domain statistical model for a single image that permits the use of a likelihood that is separable in the multifractal parameters via data augmentation. Second, a joint Bayesian model for multivariate images is formulated in which prior models based on gamma Markov random fields encode the assumption of the smooth evolution of multifractal parameters between the image components. The design of the likelihood and of conjugate prior models is such that exploitation of the conjugacy between the likelihood and prior models enables an efficient estimation procedure that can handle a large number of data components. Numerical simulations conducted using sequences of multifractal images demonstrate that the proposed procedure significantly outperforms previous univariate benchmark formulations at a competitive computational cost.

Scale-free dynamics commonly appear in individual components of multivariate data. Yet, while the behavior of cross-components is crucial in modeling real-world multivariate data, their examination often suggests departures from exact multivariate self-similarity (also termed fractal connectivity). The present paper introduces a multivariate Gaussian stochastic process with Hadamard (i.e., entry-wise) self-similar scale-free dynamics, controlled by a matrix Hurst parameter H, that allows departures from fractal connectivity. The properties of its wavelet coefficients and wavelet spectrum are studied, enabling the estimation of H and of the fractal connectivity parameter. Furthermore, it permits the computation of closed-form confidence intervals for the estimates based on approximate (wavelet) covariances. Finally, these developments enable us to devise a test for fractal connectivity. Monte Carlo simulations are used to assess the accuracy of the proposed approximate confidence intervals and the performance of the fractal connectivity test.

Texture analysis is an image processing task that can be conducted using the mathematical framework of multifractal analysis to study the regularity fluctuations of image intensity and the practical tools for their assessment, such as (wavelet) leaders. A recently introduced statistical model for leaders enables the Bayesian estimation of multifractal parameters. It significantly improves performance over standard (linear regression based) estimation. However, the computational cost induced by the associated nonstandard posterior distributions limits its application. The present work proposes an alternative Bayesian model for multifractal analysis that leads to more efficient algorithms. It relies on three original contributions: A novel generative model for the Fourier coefficients of log-leaders; an appropriate reparametrization for handling its inherent constraints; a data-augmented Bayesian model yielding standard conditional posterior distributions that can be sampled exactly. Numerical simulations using synthetic multifractal images demonstrate the excellent performance of the proposed algorithm, both in terms of estimation quality and computational cost.

Texture analysis can be embedded in the mathematical framework of multifractal (MF) analysis, enabling the study of the fluctuations in regularity of image intensity and providing practical tools for their assessment, wavelet leaders. A statistical model for leaders was proposed permitting Bayesian estimation of MF parameters for images yielding improved estimation quality over linear regression based estimation. This present work proposes an extension of this Bayesian model for patch-wise MF analysis of images. Classical MF analysis assumes space homogeneity of the MF properties whereas here we assume MF properties may change between texture elements and we do not know where the changes are located. This paper proposes a joint Bayesian model for patches formulated using spatially smoothing gamma Markov Random Field priors to counterbalance the increased statistical variability of estimates caused by small patch sizes. Numerical simulations based on synthetic multi-fractal images demonstrate that the proposed algorithm outperforms previous formulations and standard estimators.

International audience

Texture characterization is a central element in many image processing applications. Multifractal analysis is a useful signal and image processing tool, yet, the accurate estimation of multifractal parameters for image texture remains a challenge. This is due in the main to the fact that current estimation procedures consist of performing linear regressions across frequency scales of the 2D dyadic wavelet transform, for which only a few such scales are computable for images. The strongly non-Gaussian nature of multifractal processes, combined with their complicated dependence structure, makes it difficult to develop suitable models for parameter estimation. Here, we propose a Bayesian procedure that addresses the difficulties in the estimation of the multifractality parameter. The originality of the procedure is threefold. The construction of a generic semiparametric statistical model for the logarithm of wavelet leaders; the formulation of Bayesian estimators that are associated with this model and the set of parameter values admitted by multifractal theory; the exploitation of a suitable Whittle approximation within the Bayesian model which enables the otherwise infeasible evaluation of the posterior distribution associated with the model. Performance is assessed numerically for several 2D multifractal processes, for several image sizes and a large range of process parameters. The procedure yields significant benefits over current benchmark estimators in terms of estimation performance and ability to discriminate between the two most commonly used classes of multifractal process models. The gains in performance are particularly pronounced for small image sizes, notably enabling for the first time the analysis of image patches as small as 64 × 64 pixels.