Conventional magnetic nonvolatile-static random access memory (MNV-SRAM) suffers from large store current, which leads to low area and energy efficiency, severely limiting their development and application. This paper proposes a 10T-2MTJ NV-SRAM cell based on the in-plane voltage-gated spin-orbit torque magnetic tunnel junction (VGSOT-MTJ), which enables field-free deterministic magnetization switching and reduces the required store current by leveraging the voltage-controlled magnetic anisotropy (VCMA) effect to assist the store operation. Thereby, the proposed design achieves the smallest SRAM cell area compared to prior works, due to the relaxed transistor drive strength requirement. On the other hand, existing NV-SRAM restore schemes exhibit a substantial deterioration in restore error ratio (RSER) with increasing MTJ resistance. Targeting the high resistance characteristics of VGSOT-MTJ, we innovatively propose a pre-charge restore scheme with sensitive transistor isolation. Simulation results demonstrate that the proposed design achieves the lowest read and write energy in SRAM mode, with store energy 1.58× to 2.48× lower than other in-plane MTJ-based designs. And the proposed restore scheme significantly improves restore reliability with over 98.7% RSER enhancement, and shows superior robustness across different MTJ resistances and tunnel magnetoresistance ratio (TMR) conditions.

Linear interpolation is widely used in algorithms such as image segmentation, but the existing compute-in-memory (CIM) architectures cannot satisfy the needs of linear interpolation. This paper proposes a CIM macro based on static random-access memory (SRAM) that implements linear interpolation for the first time. Swing multiplication and accumulation are proposed in this paper for linear interpolation operations. In addition, the proposed circuit can be used for multiply-and-accumulate (MAC) operation and supports parallel updating and computing. A new adder tree by reused the adders inside the multiplier to implement the accumulation operation. The proposed circuit can improve the area efficiency as no additional adder tree circuit is required. The design is implemented in a 28 nm process and area efficiency can achieve 0.059 TOPS/mm2for MAC operation. When operating with an 8-bit linear interpolation, this CIM macro achieves access times of 6−9 ns and energy efficiencies of 11.13−17.72 TOPS/W. Under MAC operation with 8-bit inputs and weights, this CIM macro achieves access time of 6.36−9.47 ns and energy efficiency of 4.61−8.36 TOPS/W for 19-bit outputs.

This article proposes an exceptionally reliable and low-cost quadruple node upset tolerant latch ($LC$-QNUTL) suitable for the 65 nm CMOS technology. The innovative$LC$-QNUTL latch is primarily composed of three soft-error-immune (SEI) static random-access memory (SRAM) cells and a triple-level C-element (CE) unit, which includes five two-input CE and a clock-gating (CG)-based two-input CE. The SEI SRAM cell utilizes polarity hardening technology and source-isolation technology, significantly reducing the number of sensitive nodes and enhancing the latch’s stability. By using the high-speed transmission gate (TG) technology and stacked structures, the proposed latch offers minimal overhead in terms of delay and power consumption, yielding an improved power delay area product (PDAP). When compared to contemporary quadruple node upset (QNU)-tolerant latch designs (including HLMR, 4NUHL, and LDAVPM), the new design offers substantial improvements—29.53% less delay, 80.09% reduced power consumption, 58.52% smaller silicon area, and 433.43% improved comprehensive PDAP on average. Furthermore, simulation results demonstrate that the$LC$-QNUTL latch exhibits reduced sensitivity to process, voltage, and temperature (PVT) variations, thus providing superior reliability, which makes it an ideal choice for safety-critical applications.