EDBT 2026 Demo / reviewers in the wild / expert
Igor Bazovsky Jr.
dblp:167/6533
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1986
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Computer networks · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 87% Hardware reliability and fault tolerance · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › design for testability
built-in self-test |
0.0 | 1 | 1986 | Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986 |
Electronic design automation › hardware verification and test
fault coverage |
0.0 | 1 | 1986 | Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986 |
Hardware reliability and fault tolerance
reliability and availability modeling |
0.0 | 1 | 1986 | Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986 |
Methods — techniques the papers use, named apart from their topics
markov chain · 0.0MTBF analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1986 | Fault Coverage of Intelligent Switching NetworksabstractCoverage is a systems parameter describing the effectiveness of self-test procedures chosen for built-in tests (BIT) and other design provisions, such as recoverability, for protection of a system against faults. Classical reliability equations can be substantially modified by the inclusion of the coverage parameter because failures due to insufficient coverage often turn out to be the major cause of system failure. With good coverage, reliability and availability are greatly enhanced, often much more cost-effectively than by the indiscriminant addition of redundancy and/or spares. A general equation has been found useful in quickly evaluating system MTBF when coverage is taken into account. Both Markov chain and non-Markov chain examples are discussed. Igor Bazovsky Sr., Igor Bazovsky Jr. |
IEEE J. Sel. Areas Commun. | 2 |