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Igor Bazovsky Jr.

dblp:167/6533 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1986
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 87% Hardware reliability and fault tolerance · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test › design for testability
built-in self-test
0.011986
Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986
Electronic design automation › hardware verification and test
fault coverage
0.011986
Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986
Hardware reliability and fault tolerance
reliability and availability modeling
0.011986
Fault Coverage of Intelligent Switching Networks · IEEE J. Sel. Areas Commun. 1986

Methods — techniques the papers use, named apart from their topics

markov chain · 0.0MTBF analysis · 0.0
YearPublicationVenuePosition
1986 Fault Coverage of Intelligent Switching Networks
abstract
Coverage is a systems parameter describing the effectiveness of self-test procedures chosen for built-in tests (BIT) and other design provisions, such as recoverability, for protection of a system against faults. Classical reliability equations can be substantially modified by the inclusion of the coverage parameter because failures due to insufficient coverage often turn out to be the major cause of system failure. With good coverage, reliability and availability are greatly enhanced, often much more cost-effectively than by the indiscriminant addition of redundancy and/or spares. A general equation has been found useful in quickly evaluating system MTBF when coverage is taken into account. Both Markov chain and non-Markov chain examples are discussed.
Igor Bazovsky Sr., Igor Bazovsky Jr.
IEEE J. Sel. Areas Commun.2