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Ernst Strasser

dblp:17/3844 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1995
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 67% Integrated circuit design · 33%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › technology computer-aided design
process simulation
0.011995
Algorithms and models for cellular based topography simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Integrated circuit design
semiconductor process modeling
0.011995
Algorithms and models for cellular based topography simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Electronic design automation › technology computer-aided design › process simulation
topography simulation
0.011995
Algorithms and models for cellular based topography simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995

Methods — techniques the papers use, named apart from their topics

morphological operations · 0.0level set method · 0.0cellular automata · 0.0
YearPublicationVenuePosition
1995 Algorithms and models for cellular based topography simulation
abstract
A general simulation method for three-dimensional surface advancement has been developed and coupled with physical models for etching and deposition. The surface advancement algorithm is based on morphological operations derived from image processing which are performed on a cellular material representation. This method allows arbitrary changes of the actual geometry according to a precalculated etch or deposition rate distribution and can support very complex structures with tunnels or regions of material which are completely disconnected from other regions. Surface loops which result from a growing or etching surface intersecting with itself are inherently avoided. The etch or deposition rate distribution along the exposed surface is obtained from macroscopic point advancement models which consider information about flux distributions and surface reactions of directly and indirectly incident particles.>
Ernst Strasser, Siegfried Selberherr
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1