An extended system MSST (MIMOLA software system test generator), and its algorithms for automatic test generation are presented. In a hierarchical, mixed-level approach (from gate to system level) test patterns for sequential circuits and test programs for external testing or self-testing (diagnostics) of microprocessor boards or processor systems can be generated automatically. In a complete hierarchy lower bounds for test coverage are easily computable. The MIMOLA design system (including MSST) has been installed on VAX, APOLLO, SUN, and several other host machines. Several production line test applications show good results.>

An extended system for automatic test generation and its algorithm are presented. In a hierarchical mixed-level approach (from gate- to system-level), test patterns for sequential circuits of arbitrary depth, and even test programs for either external or self-test of microprocessor boards or processor systems, can be generated automatically. In a complete hierarchy, lower bounds for test coverage are easily computable. Applications in real production-line testing have shown good results.>

A method to automatically generate functional self-test programs for arbitrary processor systems including microprogrammable and custom designed special purpose types is presented. Only commonly available user information is needed, but gate-level details can be utilized as well. The generated self-test programs perform user guided tests for memory function and register decoding, functional or gate-level derived tests for combinational modules, and a machine status check to detect undesired side-effects. The programs are given in the micro- or machine code of the target system, ready for execution. First applications have shown promising results.