This paper studies the feasibility to implement the extended Radiated Two-Stage (RTS) test method on RF receiver performance for Vehicular 5G telematic unit. It firstly introduces the basic concept of RTS test method, which is also proposed by 3GPP in TR 37.977 for RF receiver measurement on LTE User Equipment (UE). To evaluate the feasibility of extending RTS from 2Rx in LTE system to 4Rx in 5G system on sub-6G bands, this paper will present analysis of minimum isolation requirement based on both the simulation results and real measurement results on the vehicular telematic unit. This paper proves that RTS method is still valid when evaluating 5G 4*4 MIMO performance of full-vehicle size device.

Uncorrectable memory errors are one of the major failure causes in datacenters. In this paper, we present an empirical study correlating correctable errors (CEs) and uncorrectable errors (UEs) using the large-scale field data across 3 major dual in-line memory module (DIMM) manufacturers from a contemporary server farm of ByteDance. Different from the previous studies, our study is the first to comprehend the error-bit information of CEs and the DIMM part numbers. Unlike the traditional chipkill error correction code (ECC), in contemporary Intel server platforms the ECC gets weakened, not able to tolerate some error-bit patterns from a single chip. Using obtainable coarse-grained ECC knowledge, we derive a new indicator from the error-bit information: risky CE occurrence in terms of ECC guaranteed coverage. From the data, we show that the new indicator has a consistently high sensitivity and specificity in the test of future UE occurrences across DIMMs from different manufacturers. This leads us to conjecture that the weakened ECC substantially contributes to many UEs today. The new risky CE indicator is then applied in predicting the future UE occurrence based on the CE history. We empirically demonstrate how practically useful predictors are constructed in conjunction with other useful attributes such as certain micro-level fault indicators and DIMM part numbers, achieving the state-of-the-art performance.