Demo Data from EDBT 2026 / reviewers in the wild / expert
C. D. Latino
dblp:173/1839
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1974
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
fault detection |
0.0 | 1 | 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks" · IEEE Trans. Computers 1974 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks" · IEEE Trans. Computers 1974 |
Electronic design automation › hardware verification and test › fault detection
multiple fault detection |
0.0 | 1 | 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks" · IEEE Trans. Computers 1974 |
Electronic design automation › logic synthesis
combinational network |
0.0 | 1 | 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks" · IEEE Trans. Computers 1974 |
Electronic design automation
logic synthesis |
0.0 | 1 | 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks" · IEEE Trans. Computers 1974 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1974 | Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks"abstractBosson and Hong1 have developed an effective procedure for multiple fault detection. However, their claim that their procedure gives near-minimal results is not necessarily the case. C. D. Latino, Jon G. Bredeson |
IEEE Trans. Computers | 1 |