EDBT 2026 Demo / reviewers in the wild / expert
Longxiang Yin
dblp:176/8418
· DBLP profile ↗
3ranked-venue papers
1as first author
0since 2021 · last 2019
0000-0003-2924-3949ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 2 · 1 first-authorSystems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Integrated circuit design · 39% Memory systems · 25% Reconfigurable computing and FPGAs · 19% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › semiconductor devices › multi-gate devices
FinFET |
0.4 | 2 | 2018 | Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate · Sci. China Inf. Sci. 2018 Calibration of drift-diffusion model in quasi-ballistic transport region for FinFETs · Sci. China Inf. Sci. 2018 |
Reconfigurable computing and FPGAs
FPGA architecture |
0.4 | 1 | 2019 | Merging Everything (ME): A Unified FPGA Architecture Based on Logic-in-Memory Techniques · DAC 2019 |
Memory systems › processing-in-memory
logic-in-memory |
0.4 | 1 | 2019 | Merging Everything (ME): A Unified FPGA Architecture Based on Logic-in-Memory Techniques · DAC 2019 |
Integrated circuit design › analog and mixed-signal circuits
device modeling |
0.3 | 1 | 2018 | Calibration of drift-diffusion model in quasi-ballistic transport region for FinFETs · Sci. China Inf. Sci. 2018 |
Hardware reliability and fault tolerance › integrated circuit reliability
self-heating |
0.3 | 1 | 2018 | Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate · Sci. China Inf. Sci. 2018 |
Memory systems
processing-in-memory |
0.1 | 1 | 2019 | Merging Everything (ME): A Unified FPGA Architecture Based on Logic-in-Memory Techniques · DAC 2019 |
Methods — techniques the papers use, named apart from their topics
drift-diffusion model · 0.3calibration · 0.3
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | Merging Everything (ME): A Unified FPGA Architecture Based on Logic-in-Memory TechniquesabstractNo abstract available. Xiaoming Chen 0003, Longxiang Yin, Bosheng Liu, Yinhe Han 0001 |
DAC | 2 |
| 2018 | Calibration of drift-diffusion model in quasi-ballistic transport region for FinFETs
Shaoyan Di, Longxiang Yin, Gang Du |
Sci. China Inf. Sci. | 3 |
| 2018 | Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate
Longxiang Yin, Gang Du |
Sci. China Inf. Sci. | 1 |