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Longsheng Wu

dblp:177/0808 · DBLP profile ↗
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3ranked-venue papers
0as first author
2since 2021 · last 2025
—ORCID · unresolved

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2 · 2 since 2021Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Integrated circuit design · 100%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor devices › image sensor
CMOS image sensor
1.622025
An 85 mm×89 mm 64M pixel high-speed CMOS image sensor with a negative capacitance circuit · Sci. China Inf. Sci. 2025
A high consistency ramp circuit design method for negative feedback adaptive adjustment mechanism applied to large area array CMOS image sensors · Sci. China Inf. Sci. 2024
Integrated circuit design › analog and mixed-signal circuits
analog circuit design
0.912025
An 85 mm×89 mm 64M pixel high-speed CMOS image sensor with a negative capacitance circuit · Sci. China Inf. Sci. 2025
Integrated circuit design
analog and mixed-signal circuits
0.812024
A high consistency ramp circuit design method for negative feedback adaptive adjustment mechanism applied to large area array CMOS image sensors · Sci. China Inf. Sci. 2024

Methods — techniques the papers use, named apart from their topics

negative capacitance · 0.9
YearPublicationVenuePosition
2025 An 85 mm×89 mm 64M pixel high-speed CMOS image sensor with a negative capacitance circuit
Ruiming Xu, Zhongjie Guo, Suiyang Liu, Ningmei Yu, Longsheng Wu
Sci. China Inf. Sci.6
2024 A high consistency ramp circuit design method for negative feedback adaptive adjustment mechanism applied to large area array CMOS image sensors
Zhongjie Guo, Ruiming Xu, Suiyang Liu, Ningmei Yu, Longsheng Wu
Sci. China Inf. Sci.7
2016 Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory
Li Chen 0001, Longsheng Wu, Mo Chen 0008
J. Electron. Test.4