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Donald C. Jessep Jr.

dblp:177/1220 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 1973
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Hardware reliability and fault tolerance · 84% Memory systems · 16%

Topics — the 6 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › error correction
error-correcting codes
0.021973
Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973
Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973
Hardware reliability and fault tolerance
error correction
0.011973
Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973
Memory systems › magnetic memory
magnetic bubble memory
0.011973
Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973
Hardware reliability and fault tolerance
memory fault tolerance
0.011973
Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973
Hardware reliability and fault tolerance › error correction › error-correcting codes
SECDED
0.011973
Lookaside Techniques for Minimum Circuit Memory Translators · IEEE Trans. Computers 1973
Hardware reliability and fault tolerance
reliability modeling
0.011973
Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability · IEEE Trans. Computers 1973

Methods — techniques the papers use, named apart from their topics

self-checking circuit design · 0.0parity check matrix · 0.0hamming code · 0.0firmware-based correction · 0.0error-correcting codes · 0.0
YearPublicationVenuePosition
1973 Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability
abstract
This paper reports a study on the design and modeling of a highly reliable bubble-memory system. This system has the capability of correcting a single 16-adjacent bit-group error resulting from failures in a single basic storage module (BSM), and detecting with a probability greater than 0.99 any double errors resulting from failures in BSM's. The encoding/decoding network (memory translator) is designed to be self-checking, i.e., a single circuit failure in the translator wiH not produce an erroneous output that goes undetected. The system is able to perform reliable configuration in the event of uncorrectable BSM failures, memory translator failures, and dual-memory buffer failures; even in the presence of a single failure in the status registers controlling the configuration network. The bubble memory under study permits serial accessing of the store with 64 x 1024 bit blocks at a 100-kHz rate. The objective of this study is to develop good fault-tolerant design and analysis methods adequate for newly emerging technologies and prove the practicality by example. The reliability modeling study justifies the design philosophy adopted of employing memory data encoding and a translator to correct single group errors and detect double group errors to enhance the overall system reliability. By a proper design of the memory translator based on a new checking technique, a uniformly high percentage of multiple b-adjacent bit-group error detection is achieved through the use of a proposed code (detects 99.99695 percent of double b-adjacent bit-group errors and 99.9985 percent of triple or more b-adjacent bit-group errors).
Willard G. Bouricius, William C. Carter, Edward P. Hsieh, Donald C. Jessep Jr., Aspi B. Wadia
IEEE Trans. Computers4
1973 Lookaside Techniques for Minimum Circuit Memory Translators
abstract
This paper demonstrates two improvements in coding techniques that could be used for memory word coding. First, within the fixed structure of a Hamming single-error-correcting, double-error-detecting (SEC/DED) code, an improvement can be obtained in circuit cost and operational speed over more conventional code implementations. Second, the mechanics of error correction in a fault-tolerant computer may be carried out via conventional hardware means or by use of the existing system facilities, such as the combination of the microprogram unit, local store, and the arithmetic-logic unit. These improvements may be obtained by the use of Rotational Coding schemes in conjunction with a technique calied "lookaside correction." This paper first shows a generalized algorithm for specifying the parity check matrix of Rotational Codes. The structure implemented by the parity check matrix in this paper is not merely encoding and decoding circuitry, but translates between Rotational Code forms and byte-parity encoded forms. The unique feature of these translators is that use of the Rotational Code permits the error correction to be performed on only a subset of the data word bits, and only if a single-error condition has been detected. The correction mechanism may be either a hardware logic circuit or firmware. The paper concludes with a comparison of the circuit requirements and correctional speed of the Hamming (72, 64) single-error-correcting, double-error-detecting code, as it normally would be implemented, and a Rotational Code translator also operating on 64 data bits and 8 check bits.
William C. Carter, Keith A. Duke, Donald C. Jessep Jr.
IEEE Trans. Computers3