Demo Data from EDBT 2026 / reviewers in the wild / expert
Douglas A. Anderson
dblp:177/1225
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1973
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 75% Integrated circuit design · 25% |
Topics — the 3 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
error-detecting codes |
0.0 | 1 | 1973 | Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes · IEEE Trans. Computers 1973 |
Hardware reliability and fault tolerance
self-checking circuits |
0.0 | 1 | 1973 | Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes · IEEE Trans. Computers 1973 |
Hardware reliability and fault tolerance › self-checking circuits
totally self-checking checker |
0.0 | 1 | 1973 | Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes · IEEE Trans. Computers 1973 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1973 | Design of Totally Self-Checking Check Circuits for m-Out-of-n CodesabstractThe design of totally self-checking check circuits for m-out-of-n codes is described. Totally self-checking m-out-of-n checkers provide an error indication whenever the input is not an m-out-of-n code or whenever a fault occurs within the checker itself. Since the checker checks itself, there is no need for additional maintenance access or periodic exercise of the checker to verify its ability to detect errors. The basic structure of the checker relies on the use of majority detection circuits. Various gate level implementations for the majority detection circuits are also presented, although the self-checking capability of the checker does not depend on their particular implementation since they are exhaustively tested by code inputs. The self-testing checkers for k-out-of-2k codes are discussed in the most detail since the totally self-checking checkers for 1-out-of-n and arbitrary m-out-of-n codes are constructed by first translating the code to a k-out-of-2k code via a totally self-checking translator. Douglas A. Anderson, Gernot Metze |
IEEE Trans. Computers | 1 |