The problem of learning a sparse model is conceptually interpreted as the process of identifying active features/samples and then optimizing the model over them. Recently introduced safe screening allows us to identify a part of non-active features/samples. So far, safe screening has been individually studied either for feature screening or for sample screening. In this paper, we introduce a new approach for safely screening features and samples simultaneously by alternatively iterating feature and sample screening steps. A significant advantage of considering them simultaneously rather than individually is that they have a synergy effect in the sense that the results of the previous safe feature screening can be exploited for improving the next safe sample screening performances, and vice-versa. We first theoretically investigate the synergy effect, and then illustrate the practical advantage through intensive numerical experiments for problems with large numbers of features and samples.

Careful tuning of a regularization parameter is indispensable in many machine learning tasks because it has a significant impact on generalization performances.Nevertheless, current practice of regularization parameter tuning is more of an art than a science, e.g., it is hard to tell how many grid-points would be needed in cross-validation (CV) for obtaining a solution with sufficiently small CV error.In this paper we propose a novel framework for computing a lower bound of the CV errors as a function of the regularization parameter, which we call regularization path of CV error lower bounds.The proposed framework can be used for providing a theoretical approximation guarantee on a set of solutions in the sense that how far the CV error of the current best solution could be away from best possible CV error in the entire range of the regularization parameters.We demonstrate through numerical experiments that a theoretically guaranteed a choice of regularization parameter in the above sense is possible with reasonable computational costs.