EDBT 2026 Demo / reviewers in the wild / expert
Douglas B. Armstrong
dblp:178/4974
· DBLP profile ↗
7ranked-venue papers
7as first author
0since 2021 · last 1972
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 7 · 7 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
7 papers |
Electronic design automation · 61% Integrated circuit design · 32% Hardware reliability and fault tolerance · 6% |
Topics — the 17 heaviest of 17, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
digital circuit design |
0.0 | 3 | 1969 | Design of Asynchronous Circuits Assuming Unbounded Gate Delays · IEEE Trans. Computers 1969 Realization of Asynchronous Sequential Circuits Without Inserted Delay Elements · IEEE Trans. Computers 1968 Magnetic Analogs of Relay Contact Networks for Logic · IRE Trans. Electron. Comput. 1960 |
Electronic design automation
hardware verification and test |
0.0 | 2 | 1972 | A Deductive Method for Simulating Faults in Logic Circuits · IEEE Trans. Computers 1972 On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets · IEEE Trans. Electron. Comput. 1966 |
Electronic design automation › hardware verification and test › fault simulation
deductive fault simulation |
0.0 | 1 | 1972 | A Deductive Method for Simulating Faults in Logic Circuits · IEEE Trans. Computers 1972 |
Electronic design automation › hardware verification and test
fault simulation |
0.0 | 1 | 1972 | A Deductive Method for Simulating Faults in Logic Circuits · IEEE Trans. Computers 1972 |
Electronic design automation
logic synthesis |
0.0 | 5 | 1969 | On the Efficient Assignment of Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 A Programmed Algorithm for Assigning Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 Design of Asynchronous Circuits Assuming Unbounded Gate Delays · IEEE Trans. Computers 1969 |
Integrated circuit design
asynchronous circuit design |
0.0 | 1 | 1969 | Design of Asynchronous Circuits Assuming Unbounded Gate Delays · IEEE Trans. Computers 1969 |
Hardware reliability and fault tolerance
self-checking circuits |
0.0 | 1 | 1969 | Design of Asynchronous Circuits Assuming Unbounded Gate Delays · IEEE Trans. Computers 1969 |
Integrated circuit design › digital circuit design › sequential circuit design
asynchronous sequential circuits |
0.0 | 1 | 1968 | Realization of Asynchronous Sequential Circuits Without Inserted Delay Elements · IEEE Trans. Computers 1968 |
Electronic design automation › logic synthesis
state assignment |
0.0 | 2 | 1962 | On the Efficient Assignment of Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 A Programmed Algorithm for Assigning Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 |
Electronic design automation › hardware verification and test › test generation › fault test generation
fault detection test generation |
0.0 | 1 | 1966 | On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets · IEEE Trans. Electron. Comput. 1966 |
Electronic design automation › hardware verification and test
fault diagnosis |
0.0 | 1 | 1966 | On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets · IEEE Trans. Electron. Comput. 1966 |
Integrated circuit design › digital circuit design › logic design
logic circuits |
0.0 | 1 | 1972 | A Deductive Method for Simulating Faults in Logic Circuits · IEEE Trans. Computers 1972 |
Electronic design automation › logic synthesis
asynchronous circuit synthesis |
0.0 | 1 | 1969 | Design of Asynchronous Circuits Assuming Unbounded Gate Delays · IEEE Trans. Computers 1969 |
Integrated circuit design › digital circuit design
combinational logic |
0.0 | 1 | 1966 | On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets · IEEE Trans. Electron. Comput. 1966 |
Electronic design automation › logic synthesis
finite state machine synthesis |
0.0 | 2 | 1962 | On the Efficient Assignment of Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 A Programmed Algorithm for Assigning Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 |
Integrated circuit design › emerging device technologies
magnetic logic circuits |
0.0 | 1 | 1960 | Magnetic Analogs of Relay Contact Networks for Logic · IRE Trans. Electron. Comput. 1960 |
Electronic design automation › logic synthesis
two-level logic minimization |
0.0 | 1 | 1962 | On the Efficient Assignment of Internal Codes to Sequential Machines · IRE Trans. Electron. Comput. 1962 |
Methods — techniques the papers use, named apart from their topics
parallel fault simulation comparison · 0.0deductive fault simulation · 0.0unbounded gate delay assumption · 0.0stuck-at fault model · 0.0path sensitizing · 0.0line delay constraints · 0.0line and gate delay assumptions · 0.0flow table analysis · 0.0equivalent normal form · 0.0completion detection · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1972 | A Deductive Method for Simulating Faults in Logic CircuitsabstractA deductive method of fault simulation is described, which "deduces" the faults defected by a test at the same time that it simulates explicitly only the good behavior of logic circuit. For large logic circuits (at least several thousand gates) it is expected to be faster than "parallel" fault simulators, but uses much more computer memory than do parallel simulators. Douglas B. Armstrong |
IEEE Trans. Computers | 1 |
| 1969 | Design of Asynchronous Circuits Assuming Unbounded Gate DelaysabstractThis paper considers the general problem of the synthesis of asynchronous combinational and sequential circuits based on the assumption that gate delays may be unbounded and that line delays are suitably constrained. Certain problems inherent to circuit realizations with unbounded gate delays are discussed and methods of solving them are proposed. Specific synthesis techniques are presented for both combinational and sequential circuits. The use of completion detection necessitated by the assumption of unbounded gate delays also causes the circuits to stop operating for approximately half of all possible single faults, thus achieving a degree of self-checking. Douglas B. Armstrong, Arthur D. Friedman, Prem R. Menon |
IEEE Trans. Computers | 1 |
| 1968 | Realization of Asynchronous Sequential Circuits Without Inserted Delay ElementsabstractAbstract—In an earlier paper, Unger showed that any normal mode flow table can be realized by an asynchronous sequential circuit without inserted delays in the feedback paths if and only if the flow table contains no essential hazards. No restrictions were placed on the relative magnitudes of line and gate delays. In this paper, we show that if the line delays are less than the minimum gate delay in the circuit, any normal mode sequential function can be realized without inserted delays. It is also shown that a weaker line delay assumption is sufficient. Two procedures for realizing asynchronous sequential circuits without inserted delays are presented. Douglas B. Armstrong, Arthur D. Friedman, Prem R. Menon |
IEEE Trans. Computers | 1 |
| 1966 | On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsabstractA procedure is described for finding, by shortcut methods, a near-minimal set of tests for detecting all single faults in a combinational logic net. The procedure should prove useful for nets which are too large to be treated by more exact methods [2]. The set of tests so found also appears useful for diagnosing (i.e., locating) faults. The class of faults considered is that which causes connections to be stuck at logical one or logical zero. The nets considered may include AND, OR, NAND, NOR, and NOT gates. The bases of the procedure are the ``path sensitizing'' concept, and reduction of a net to its ``equivalent normal form,'' abbreviated enf. It is shown that if a set of tests can be found which detects an appropriate subset of faults in the enf, this set will detect all faults in the original net. The enf also provides a vehicle for systematically finding the most desirable tests, namely those which each detect many faults in the net. The procedure is illustrated in detail by an example. Douglas B. Armstrong |
IEEE Trans. Electron. Comput. | 1 |
| 1962 | A Programmed Algorithm for Assigning Internal Codes to Sequential MachinesabstractA relatively fast procedure for assigning codes to the internal states of a sequential machine is described, which leads to a reasonably economical logical realization of the machine in many cases. The method is applicable to both completely and incompletely specified state tables, and permits the use of redundant internal variables if desired. An algorithm which implements the method approximately, and which is nonenumerative, has been programmed for the 7090 computer. The program handles problems with up to 100 internal states and 30 input symbols, or 3000 total states. It has performed a problem of maximum size in 120 seconds. Although fast, the method sometimes fails to attain truly economical logic in cases where unusually simple realizations are known to exist (e.g., the shift register). More comprehensive methods are now known, which in principle can produce better results, but which will be far more tedious to execute. They will be reported separately. Douglas B. Armstrong |
IRE Trans. Electron. Comput. | 1 |
| 1962 | On the Efficient Assignment of Internal Codes to Sequential MachinesabstractA set of procedures for assigning codes to internal states of a synchronous sequential machine so as to minimize the internal logic in two-level form is proposed. The procedures are based on interpreting the state table of a sequential machine as a set of mappings from present states into next states, under control of the inputs. Attention is focused on a particular subset of these mappings, called pr mappings. A numerical score is assigned to each pr mapping, which is a measure of the desirability of ``selecting'' the mapping for inclusion in a ``basic set'' of mappings. A basic set has the property of determining a unique code assignment (within a symmetry of the cube of internal states). The procedures are applied to a 3-stage shift register and result in the optimum encoding for that device. Finally, it is briefly indicated how three previous assignment methods, including one developed by the author, are related to those described here. Algorithms are presented for some but not all of the proposed procedures. These algorithms must be completed before the proposals can be implemented by a computer program. Douglas B. Armstrong |
IRE Trans. Electron. Comput. | 1 |
| 1960 | Magnetic Analogs of Relay Contact Networks for LogicabstractTwo techniques are described for designing multiapertured magnetic structures capable of realizing any specific logic function. The structures are made from rectangular hysteresis loop material. The designs are derived from the corresponding relay contact network by replacing each current carrying conductor in the relay circuit with its analog in the magnetic circuit, a flux-carrying conductor, replacing the emf with a pulsed mmf; and replacing each back contact with a saturable portion of the magnetic circuit in the topological equivalent of the contact network. A flux reversal through a saturated portion may then be blocked by means of an inhibiting Current applied to a suitable winding, the current representing a logical input variable. Thus flux may be ``steered'' through the magnetic circuit in a manner analogous to the steering of current through the contact network. For planar structures the first technique may be used to obtain the analog of series-parallel and bridge type circuits; parallel circuits. It is pointed out that the analog of a relay tree can be used as a standard structure suitable for realizing any Boolean function. Representative examples of both designs are shown, and experimental data are given. Douglas B. Armstrong, Thomas H. Crowley, Umberto F. Gianola, Edmund E. Newhall |
IRE Trans. Electron. Comput. | 1 |