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John O. Paivinen

dblp:178/9376 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1953
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 87% Hardware reliability and fault tolerance · 13%

Topics — the 2 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
analog and mixed-signal circuits
0.011953
Design of triode flip-flops for long-term stability · Trans. I R E Prof. Group Electron. Comput. 1953
Integrated circuit design › digital circuit design › sequential circuit design
flip-flop
0.011953
Design of triode flip-flops for long-term stability · Trans. I R E Prof. Group Electron. Comput. 1953

Methods — techniques the papers use, named apart from their topics

worst-case tolerance analysis · 0.0analytical design method · 0.0
YearPublicationVenuePosition
1953 Design of triode flip-flops for long-term stability
abstract
Reliable electronic circuit design must account for the parameter variations over the normal life of components to insure satisfactory operation. An analytical design method is derived for an Eccles-Jordan triode flip-flop in which the “worst” condition of voltage and component tolerances conditions are assumed that assures satisfactory operation for normal conditions. The method of analysis is to divide the flip-flop circuit into separate parts, write appropriate equations, and solve them simultaneously. The design method results in the best configurations of component values, regardless of what tube may be used, and actually specifies characteristics which-the tube should have, as well as the expected life of the tube in terms of maximum plate resistance.
John O. Paivinen, Isaac L. Auerbach
Trans. I R E Prof. Group Electron. Comput.1