EDBT 2026 Demo / reviewers in the wild / expert
Charles P. Womack
dblp:180/6332
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1965
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Memory systems · 50% Hardware reliability and fault tolerance · 25% Performance modeling and evaluation · 25% |
Topics — the 3 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems › magnetic core memory
coincident-current memory |
0.0 | 1 | 1965 | Schmoo Plot Analysis of Coincident-Current Memory Systems · IEEE Trans. Electron. Comput. 1965 |
Memory systems
magnetic core memory |
0.0 | 1 | 1965 | Schmoo Plot Analysis of Coincident-Current Memory Systems · IEEE Trans. Electron. Comput. 1965 |
Hardware reliability and fault tolerance
memory reliability |
0.0 | 1 | 1965 | Schmoo Plot Analysis of Coincident-Current Memory Systems · IEEE Trans. Electron. Comput. 1965 |
Methods — techniques the papers use, named apart from their topics
oscilloscope display · 0.0instrumentation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1965 | Schmoo Plot Analysis of Coincident-Current Memory SystemsabstractThe disturbed incremental magnetization changes that accompany the read and write operations of coincident-current memories are the cause of a serious noise problem in the attainment of high-speed memory performance. This paper examines the noise problem. Relationships which express the memory driver tolerances in terms of the core characteristics are presented; the operating schmoo is evolved and from it the various schmoo responses are obtained and utilized for selection of optimum operating currents and sense amplifier threshold bias. A unique system for automatically exercising coincident-current magnetic core memory systems and visually displaying their performance characteristics is included. The instrumentation includes a versatile memory exerciser that not only subjects the memory under test to simulated conditions of computer operation, but also varies the driving currents into the stack over wide extremes and compares the resultant output signals to the information stored in the data register. Suitable synchronizing and display signals are provided to an oscilloscope which records each error as a momentary intensification of the electron beam as it sweeps the scope face. The resultant pattern is called a schmoo plot and as such provides a visual measure of performance of memory systems. Charles P. Womack |
IEEE Trans. Electron. Comput. | 1 |