Connectivity has become essential to modern manufacturing, but it also introduces new security challenges. Industrial IoT ecosystems rely on public-key cryptography to protect communications, firmware, and operational data. However, the emergence of quantum computing threatens to undermine these cryptographic foundations, exposing long-lived manufacturing systems to future attacks. This paper presents the Quantum-Secure IoT-based Digital Manufacturing Pilot, developed within the EU-funded QUBIP project, which investigates the integration of post-quantum cryptography (PQC) into IoT environments. The pilot aims to demonstrate how quantum resistant algorithms can be efficiently deployed across heterogeneous devices with limited resources to ensure data exchange and authentication. By combining software and hardware-based approaches, the proposed pilot provides a replicable model for PQC migration in digital manufacturing, ensuring long-term data integrity and resilience in the quantum era.

Modern RISC-V designs are increasingly integrating cryptographic accelerators to provide better security features while enhancing performance; however, their vulnerability to power side-channel attacks remains insufficiently investigated. This paper presents a comprehensive evaluation of such vulnerabilities in a RISCV-based AES accelerator connected via the Core-V eXtension Interface (CV-X-IF). The analysis begins at the RTL using simulated power traces, employing KL (Kullback–Leibler) divergence alongside established statistical attacks such as Correlation Power Analysis (CPA) and Differential Power Analysis (DPA). Although the former serves as an early indicator of potential leakage, simulation results highlight its limitations compared to CPA and DPA. To validate these findings, leakage trends are further examined through FPGA-based power measurement. The proposed methodology is designed to be broadly applicable to a range of cryptographic workloads and accelerator architectures. It is demonstrated on an AES accelerator implementing the scalar cryptographic extension (Zk) with pre-expanded keys. Our findings reveal that side-channel vulnerabilities can persist even in tightly integrated instruction pipelines, underscoring the importance of early-stage leakage assessment. Notably, the close alignment between RTL-level simulations and FPGA-based measurements highlights the effectiveness of the approach and its practical value for guiding secure hardware design in RISC-V ecosystems. In particular, AES serves only as a case of study; the proposed RTL and FPGA validation flow is generic and can be applied to any cryptographic accelerator.

This paper introduces an innovative approach to designing a mismatched current mirror with a fully unbalanced output, significantly reducing the minimum supply voltage requirements for Regulated Cascode Current Mirror (RCCM) Physical Unclonable Functions (PUFs). Leveraging body-driven feedback mechanisms, the proposed circuit reliably operates with supply voltages as low as 0.3V, maintaining stable power consumption through a reference bias current. The resulting PUF achieves remarkable energy efficiency, consuming only 0.3 fJ per bit, without compromising statistical performance. It exhibits a response bias of 49.42%, a reliability of 99.483%, and a uniqueness of 50.176%. Validation of this novel approach is conducted through simulations and measurements on a 130nm CMOS test-chip, considering a nominal supply voltage of 0.3V, ±10% supply voltage variations, and a temperature range from 0°C to 75°C. Rigorous experimental verification on 20 chip samples, along with detailed explanations of design methodologies, underscores the robustness and practicality of the proposed Body-PUF design. Comparative analyses against state-of-the-art literature reveal that the Body-PUF outperforms previous PUF designs in Figures of Merit (FOM), making it promising for real-world authentication scenarios. Its outstanding trade-off between performance and practicality positions it as a compelling solution for secure applications, including Internet of Things (IoT) devices and other security-critical systems.

This work presents a novel proposal for utilizing the latched ring oscillator (LRO) as a reconfigurable entropy source, outperforming the existing literature on both physical unclonable functions (PUFs) and true random number generators (TRNGs). The PUF working principle and mathematical model are proposed in this manuscript for the first time as well as its performance measured on FPGA. The proposed LRO-based PUF is$2\times $more compact than state-of-the-art PUFs on FPGA. The LRO TRNG architecture has been revisited, and an XOR-tree-based postprocessing technique has been introduced to increase the throughput from 0.76 up to 800 Mbit/s, paving the way for a novel class of high-throughput reconfigurable entropy sources. The results of NIST tests carried out also under supply voltage and temperature variations have demonstrated robust key extraction and secure random number generation for different applications. This comprehensive proposal aims to advance the state of the art in compact and high-throughput entropy sources, catering to the increasing demands of modern cryptographic hardware.

Masking is a systematic countermeasure to achieve side-channel security for cryptographic algorithms. However, its secure implementation relies on an independence assumption that can be violated by signal coupling. It has been established that coupling induced within a device can be detrimental. It was demonstrated on a$1^{st}$-order secure design (i.e., with two shares) that an adversary who can manipulate the design’s power-measurement setup can externally induce significant coupling. It can thus concretely reduce the “effective-security-order”, i.e., make$1^{st}$-order leakages as significant as$2^{nd}$-order ones with fewer measurements. This paper explores the impact of such external amplification phenomena on fabricated hardware test cases for the first time. We designed a dedicated ASIC to extend the empirical results for demonstrating impact up to the$4^{th}$order. We have systematically evaluate d factors related to adversarial control, e.g., the external measurement resistance. We also investigate d their relative influence compared to intra-design ones, i.e., internal power-grid resistance and transistors’ inherent resistance. Our study demonstrates that externally amplified coupling scale s up to concrete masked hardware designs with various amounts of shares and is not very sensitive to intra-design parameters. Therefore, providing experimental evidence that such coupling should be considered during masking validation.

This paper presents a True Random Number Generator (TRNG) exploiting latched-XOR (LX) gates and its implementation on a Xilinx Spartan 6 FPGA device. The proposed LX-TRNG aims at improving the Throughput (TP) of conventional ring oscillators (ROs) based TRNGs by combining the effect of latches metastability and ROs jitter. Measurements results have demonstrated that the generated bitstreams show very good randomness exhibiting a byte (bit) entropy of 7.9979 (0.9997), according to T8-test of AIS-31. The proposed TRNG has also been extensively tested under voltage and temperature variations showing very good robustness. In particular both NIST’s and AIS-31 tests are passed for all the considered supply voltage and temperature ranges. The FPGA implementation occupies only 9 Slices and, despite its compactness, it exhibits a throughput as high as 12.5 Mbit/s with a 50 MHz operating frequency. The computation of the figure of merit$FOM_{E}$has shown the capability of the proposed TRNG to optimize the trade-off between hardware resources, bitstreams entropy and throughput, outperforming previous works.

The Time Enclosed Logic (TEL) is a dual-rail signaling protocol used in the context of cryptographic circuits in order to maintain the time enclosing of information leakage also in the presence of capacitive mismatch. The capacitive mismatch, due to non-perfectly balanced differential routing, provides additional data-dependent leakage that a malicious adversary could use to recover secret information from a hardware implementation. In this work, a novel TEL-compatible standard-cell based flip-flop for cryptographic application is presented. The new flip-flop is intended to be compatible also for FPGA applications. The novel standard-cell architecture has been tested with energy-defined metrics adopting a 4-bit register as case study, implemented in 40nm CMOS process. It has been found that it is able to reduce the data-dependence of the power consumption up to ×0.05 also in the presence of strong mismatch if compared to unprotected CMOS. A comparison with WDDL and MDPL has shown that NED and NSD are remarkably reduced (up to ×30 and ×40 respectively), and their values are independent from the capacitive mismatch in the novel flip-flop architecture.

This paper presents the design of a novel low-voltage high-speed D-latch circuit suitable for nanometer CMOS technologies. The proposed topology is compared against the low-voltage triple-tail D-latch and its advantages are demonstrated both by simulations, under different performance/power consumption tradeoffs with a 40-nm CMOS technology, and theoretically, thanks to a simple model of the propagation delay derived for both low-voltage topologies. In order to further demonstrate the advantages of the proposed topology, it has also been used to design a D flip-flop (DFF), where thanks to the feature to need just 1 clock differential pair; a further speed improvement is achieved over the conventional triple-tail topology. Indeed, by comparing a two-stage frequency divider designed using both the triple-tail DFF and the proposed folded DFF, a 54% improvement in the maximum operating frequency is found when using the proposed folded DFF.