EDBT 2026 Demo / reviewers in the wild / expert
Benjamin Viale
dblp:191/9675
· DBLP profile ↗
2ranked-venue papers
2as first author
0since 2021 · last 2020
0000-0002-4890-1145ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 87% Integrated circuit design · 13% |
Topics — the 2 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › hardware verification › circuit-level verification
electrostatic discharge verification |
0.9 | 2 | 2020 | Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part II · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2020 Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part I · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2020 |
Electronic design automation › hardware verification and test
hardware verification |
0.9 | 2 | 2020 | Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part II · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2020 Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part I · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2020 |
Methods — techniques the papers use, named apart from their topics
machine learning · 0.9transmission line pulse simulation · 0.4nested cross-validation · 0.4graph-based analysis · 0.4
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2020 | Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part IabstractThis article describes a systematic and scalable electrostatic discharge (ESD) verification methodology embodied in a tool called ESD IP Explorer that has been specifically implemented to cover the entire design flow and to comply with custom circuit architectures. The tool identifies the ESD protection network of a circuit thanks to a flexible topology-aware mechanism and converts the circuit description of this network into a directed graph whose edges are provided with quasistatic electrical behaviors inferred from the machine learning techniques detailed in a companion paper. A graph-based analysis establishes a risk rating cartography for all top-level pad-to-pad discharge combinations. The circuit reviewer, a chip designer, or an ESD expert can, therefore, assess the ESD performances of the ESD network under study and easily investigate potential ESD design weaknesses. Benjamin Viale, Bruno Allard |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2020 | Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part IIabstractThis article gives a detailed insight on a machine learning procedure to infer quasistatic quantities of electrostatic discharge (ESD) protection structures from their instance parameters in a netlist. It resorts to a dataset of transmission line pulse (TLP) I-V curves that have been obtained from numerous transient electrical simulations. The tuning of machine learning algorithms and the quantification of their generalized prediction performances on out-of-sample data are performed by means of nested cross-validation. Resulting fitted analytical models are encompassed in a tool called ESD IP Explorer in charge of providing a systematic and scalable ESD verification methodology. This tool, which has been specifically implemented to cover the entire design flow and to comply with custom circuit architectures, is described in a former article. Benjamin Viale, Bruno Allard |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |