EDBT 2026 Demo / reviewers in the wild / expert
Darren Brown
dblp:20/2954
· DBLP profile ↗
4ranked-venue papers
1as first author
0since 2021 · last 2006
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2Artificial intelligence and machine learning · 1 · 1 first-authorSoftware engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software testing · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 77% Processor architecture and microarchitecture · 23% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Software testing
spreadsheet testing |
0.1 | 1 | 2006 | Integrating automated test generation into the WYSIWYT spreadsheet testing methodology · ACM Trans. Softw. Eng. Methodol. 2006 |
Software testing
test generation |
0.1 | 1 | 2006 | Integrating automated test generation into the WYSIWYT spreadsheet testing methodology · ACM Trans. Softw. Eng. Methodol. 2006 |
Electronic design automation › hardware verification and test
functional verification |
0.0 | 1 | 1998 | Functional Verification of a Multiple-issue, Out-of-Order, Superscalar Alpha Processor - The DEC Alpha 21264 Microprocessor · DAC 1998 |
Electronic design automation › hardware verification and test
hardware verification |
0.0 | 1 | 1998 | Functional Verification of a Multiple-issue, Out-of-Order, Superscalar Alpha Processor - The DEC Alpha 21264 Microprocessor · DAC 1998 |
Software testing › test generation
random test generation |
0.0 | 1 | 2006 | Integrating automated test generation into the WYSIWYT spreadsheet testing methodology · ACM Trans. Softw. Eng. Methodol. 2006 |
Processor architecture and microarchitecture
out-of-order execution |
0.0 | 1 | 1998 | Functional Verification of a Multiple-issue, Out-of-Order, Superscalar Alpha Processor - The DEC Alpha 21264 Microprocessor · DAC 1998 |
Processor architecture and microarchitecture
superscalar processor |
0.0 | 1 | 1998 | Functional Verification of a Multiple-issue, Out-of-Order, Superscalar Alpha Processor - The DEC Alpha 21264 Microprocessor · DAC 1998 |
Methods — techniques the papers use, named apart from their topics
random selection · 0.1goal-oriented test generation · 0.1simulation-based verification · 0.0pseudo-random test generation · 0.0functional coverage analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2006 | Integrating automated test generation into the WYSIWYT spreadsheet testing methodologyabstractSpreadsheet languages, which include commercial spreadsheets and various research systems, have had a substantial impact on end-user computing. Research shows, however, that spreadsheets often contain faults. Thus, in previous work we presented a methodology that helps spreadsheet users test their spreadsheet formulas. Our empirical studies have shown that end users can use this methodology to test spreadsheets more adequately and efficiently; however, the process of generating test cases can still present a significant impediment. To address this problem, we have been investigating how to incorporate automated test case generation into our testing methodology in ways that support incremental testing and provide immediate visual feedback. We have used two techniques for generating test cases, one involving random selection and one involving a goal-oriented approach. We describe these techniques and their integration into our testing environment, and report results of an experiment examining their effectiveness and efficiency. Marc Fisher II, Gregg Rothermel, Darren Brown, Mingming Cao, Curtis R. Cook, Margaret M. Burnett |
ACM Trans. Softw. Eng. Methodol. | 3 |
| 2003 | End-User Testing for the Lyee Methodology using the Screen Transition Paradigm and WYSIWYT
Darren Brown, Margaret M. Burnett, Gregg Rothermel |
Knowl. Based Syst. | 1 |
| 1998 | Functional Verification of a Multiple-issue, Out-of-Order, Superscalar Alpha Processor - The DEC Alpha 21264 MicroprocessorabstractDIGITAL's Alpha 21264 processor is a highly out-of-order, superpipelined, superscalar implementation of the Alpha architecture, capable of a peak execution rate of six instructions per cycle and a sustainable rate of four per cycle. The 21264 also features a 500 MHz clock speed and a high-bandwidth system interface that channels up to 5.3 Gbytes/second of cache data and 2.6 Gbytes/second of main-memory data into the processor. Simulation-based functional verification was performed on the logic design using implementation-directed, pseudo-random exercisers, supplemented with implementationspecific, hand-generated tests. Extensive functional coverage analysis was performed to grade and direct the verification effort. The success of the verification effort was underscored by first prototype chips which were used to boot multiple operating systems across several different prototype systems. Keywords Alpha, microprocessor, verification, validation, architecture, pseudo-random, coverage an... Scott A. Taylor, Michael Quinn, Darren Brown, Nathan Dohm, Scot Hildebrandt, James K. Huggins, Carl Ramey |
DAC | 3 |
| 1998 | Zen and the art of Alpha verificationabstractThe advanced architecture of the Alpha 21264 microprocessor compelled the verification team to invent far-reaching techniques to achieve the goal of booting multiple operating systems on first silicon. These techniques, built on traditional verification methodology, exposed a number of esoteric bugs prior to tape-out. Verification engineers took focused testing, pseudo-random testing, and coverage analysis to new levels in order to meet the challenge of verifying a highly out-of order, superscalar machine. A new hybrid exerciser and a method for predicting the future enhanced pseudo-random testing. A new way of looking at coverage analysis was devised. Random behavior was added to hand-coded rests, several methods were created for tackling atomic operations, and a shadow reference model was written for the most advanced branch predictor implemented to date in a commercial microprocessor. Verification techniques were also expanded to include test pattern generation and post-silicon debugging. Nathan Dohm, Carl Ramey, Darren Brown, Scot Hildebrandt, James K. Huggins, Michael Quinn, Scott A. Taylor |
ICCD | 3 |