Demo Data from EDBT 2026 / reviewers in the wild / expert
Henning Sirringhaus
dblp:202/3422
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2009
0000-0001-9827-6061ORCID · reported
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › semiconductor devices
organic electronics |
0.1 | 1 | 2009 | Materials and Applications for Solution-Processed Organic Field-Effect Transistors · Proc. IEEE 2009 |
Integrated circuit design
semiconductor device fabrication |
0.1 | 1 | 2009 | Materials and Applications for Solution-Processed Organic Field-Effect Transistors · Proc. IEEE 2009 |
Methods — techniques the papers use, named apart from their topics
printing-based manufacturing · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2009 | Materials and Applications for Solution-Processed Organic Field-Effect TransistorsabstractOrganic field-effect transistors (FETs) are presently attracting significant academic research and industrial development interests as they offer performance capabilities comparable to those of thin-film amorphous silicon transistors but at the same time are compatible with low-temperature solution/printing-based manufacturing on flexible plastic substrates. In this paper, we review recent materials advances to improve the field-effect mobility of solution-processed organic semiconductors, discuss recent insight into the physics that determines the electronic structure at the semiconductor-gate dielectric interface in these devices, and provide an overview over some of the near- and medium-term applications. Henning Sirringhaus |
Proc. IEEE | 1 |