EDBT 2026 Demo / reviewers in the wild / expert
Brent Haukness
dblp:205/0184
· DBLP profile ↗
2ranked-venue papers
0as first author
1since 2021 · last 2025
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 since 2021Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Memory systems · 83% Emerging computing paradigms · 8% High-performance computing · 7% |
Topics — the 7 heaviest of 8, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems
cache design |
0.9 | 1 | 2025 | Efficient Caching with A Tag-enhanced DRAM · HPCA 2025 |
Memory systems › cache
DRAM cache |
0.9 | 1 | 2025 | Efficient Caching with A Tag-enhanced DRAM · HPCA 2025 |
Memory systems › DRAM
DRAM microarchitecture |
0.9 | 1 | 2025 | Efficient Caching with A Tag-enhanced DRAM · HPCA 2025 |
Emerging computing paradigms
neuromorphic computing |
0.3 | 1 | 2017 | Resistive Random Access Memory for Future Information Processing System · Proc. IEEE 2017 |
Memory systems
non-volatile memory |
0.3 | 1 | 2017 | Resistive Random Access Memory for Future Information Processing System · Proc. IEEE 2017 |
Memory systems › non-volatile memory
resistive memory |
0.3 | 1 | 2017 | Resistive Random Access Memory for Future Information Processing System · Proc. IEEE 2017 |
Integrated circuit design
device-circuit co-design |
0.1 | 1 | 2017 | Resistive Random Access Memory for Future Information Processing System · Proc. IEEE 2017 |
Methods — techniques the papers use, named apart from their topics
full-system simulation · 0.9flush buffer · 0.9early tag probing · 0.9device-circuit co-design · 0.3
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2025 | Efficient Caching with A Tag-enhanced DRAMabstractAs SRAM-based caches are hitting a scaling wall, manufacturers are integrating DRAM-based caches into system designs to continue increasing cache sizes. While DRAM caches can improve the performance of memory systems, existing DRAM cache designs suffer from high miss penalties, wasted data movement, and interference between misses and demands. In this paper, we propose TDRAM, a novel DRAM microarchitecture tailored for caching. TDRAM enhances existing DRAM, such as HBM3, by adding small, low-latency mats to store tags and metadata on the same die as the data mats. These mats enable tag and data access in lockstep, in-DRAM tag comparison, and conditional data response based on the comparison result (reducing wasted data transfers), akin to SRAM cache mechanisms. TDRAM further optimizes hit and miss latencies through opportunistic early tag probing. Moreover, TDRAM introduces a flush buffer to store conflicting dirty data on write misses, eliminating data bus turnaround delays on write demands. We evaluate TDRAM in a full-system simulation using a set of HPC workloads with large memory footprints, showing that TDRAM, on average, provides $2.65 \times$ faster tag checks, $1.23 \times$ speedup, and 21% less energy consumption compared to state-of-the-art commercial and research designs. Maryam Babaie, Ayaz Akram, Wendy Elsasser, Brent Haukness, Michael R. Miller, Taeksang Song, Thomas Vogelsang, Steven C. Woo, Jason Lowe-Power |
HPCA | 4 |
| 2017 | Resistive Random Access Memory for Future Information Processing SystemabstractResistive random access memory (RRAM) is regarded as one of the most promising emerging memory technologies for next-generation embedded, standalone nonvolatile memory (NVM), and storage class memory (SCM) due to its speed, density, cost, and scalability. Considerable progress has been made in recent years on the manufacturability of RRAM, with low-density RRAM products now in production and the path to higher density parts becoming clearer. This review updates the learning on the fundamental materials and process integration needed for high-volume manufacturing and summarizes very recent progress on array level performance improvement methodology using novel techniques, and circuit level contributions for different applications. The device performance, array integration, and device/circuit codesign for memory systems are discussed. Novel applications besides embedded memory and standalone memory are addressed, including hardware security, neuromorphic computing, and nonvolatile logic systems. Huaqiang Wu, Xiao Hu Wang, Bin Gao 0006, Ning Deng 0008, Zhichao Lu, Brent Haukness, Gary Bronner, He Qian |
Proc. IEEE | 6 |