Demo Data from EDBT 2026 / reviewers in the wild / expert
Leandro M. G. Rocha
dblp:208/0128 · also Leandro Mateus Giacomini Rocha
· DBLP profile ↗
4ranked-venue papers
1as first author
2since 2021 · last 2024
0000-0003-2883-2768ORCID · verified
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 1 first-author · 2 since 2021Graphics, computer vision, multimedia, augmented reality and games · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 81% Energy-efficient computing · 19% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
timing error |
0.6 | 1 | 2022 | A Framework for Crossing Temperature-Induced Timing Errors Underlying Hardware Accelerators to the Algorithm and Application Layers · IEEE Trans. Computers 2022 |
Energy-efficient computing
thermal management |
0.2 | 1 | 2022 | A Framework for Crossing Temperature-Induced Timing Errors Underlying Hardware Accelerators to the Algorithm and Application Layers · IEEE Trans. Computers 2022 |
Hardware reliability and fault tolerance
timing guardband |
0.2 | 1 | 2022 | A Framework for Crossing Temperature-Induced Timing Errors Underlying Hardware Accelerators to the Algorithm and Application Layers · IEEE Trans. Computers 2022 |
Methods — techniques the papers use, named apart from their topics
system-level simulation · 0.6gate-level simulation · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2024 | Multidie 3-D Stacking of Memory Dominated Neuromorphic ArchitecturesabstractEvent-driven neuromorphic processors for artificial intelligence (AI) inference on edge/IoT devices require largeon-chip memory capacity, for efficient execution of spiking neural networks (NNs). In this work, we evaluate 3-D stacking benefits on SENECA, a digital neuromorphic accelerator core, sweeping itson-chip memory capacity from 2 up to 32 Mb in both legacy planar and advanced nanosheet CMOS logic nodes. In a planar CMOS node (GF-22 nm), two-die memory-on-logic (MoL) partitioning enables$8\times $moreon-chip memory, and it boosts operating frequency by 7% with 26% less power than the 2-D. Moving to an advanced nanosheet technology (imec A10), multidie (up to 7 dies) MoL stacking enables a performance increase of up to 29% and power savings up to 31%. Furthermore, a core folding (CF) partitioning in A10 shows up to 16% performance improvement with 12% total power savings with respect to the 2-D implementation on the same technology. We also demonstrate no thermal overhead for multidie stacking at advanced nodes for designs exhibiting low power density. These physical design explorations lay the foundation for system technology co-optimization studies for edge devices. Leandro M. G. Rocha, Refik Bilgic, Mohamed Naeim, Sudipta Das, Herman Oprins, Amirreza Yousefzadeh, Mario Konijnenburg, Dragomir Milojevic, James Myers, Julien Ryckaert, Dwaipayan Biswas |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |
| 2022 | A Framework for Crossing Temperature-Induced Timing Errors Underlying Hardware Accelerators to the Algorithm and Application LayersabstractTemperature rising is an unavoidable effect on VLSI and has always been a critical issue in any system-on-chip – especially when targeting compute-intensive applications. This effect increases the delay in hardware accelerators, resulting in timing errors due to unsustainable clock frequency, whose impact must be carefully evaluated on design time to measure the performance degradation of the hardware accelerator. Further, a hardware operating at a higher temperature accelerates device aging, which incurs in more timing errors. This issue is usually addressed with the inclusion of timing guardbands that compensate for the deleterious effects of temperature, ensuring the hardware accelerator works within a reliable zone, i.e., without any timing errors caused by temperature effects at runtime. However, guardbands directly result in considerable performance and efficiency losses because the circuit will be clocked at a frequency lower than its full potential. Accelerators on edge devices often dismiss such guardbands to explore the full potential of the designed circuits, posing an enormous design challenge as this approach requires a careful evaluation of the impact of timing errors on the quality of the target applications. Many algorithms, such as in multimedia and machine learning applications, are capable of tolerating hardware errors. Yet, these algorithms have a dynamic behavior (i.e., closed-loop) where a timing error can be propagated, affecting subsequent steps. Measuring the degradation-induced errors in these applications is very challenging given that an accurate gate-level simulation to investigate degradation-induced timing errors needs to be coupled dynamically with a system-level simulator to unveil how induced errors in the underlying hardware ultimately impact the algorithm execution in the hardware accelerator.This is the first work to achieve this goal. State-of-the-art works have studied accelerators under timing-errors when removing (or narrowing) guardbands. However, their approach was suitableonly for open-loop hardware accelerators which are entirely agnostic of complex interactions of the algorithms. Unlike prior work, this paper investigates temperature- and aging-induced timing-errors in the joint accelerator-algorithm interactions and their runtime impacts. Our framework investigates aging effects across the different layers starting from transistor physics all the way up to the algorithm layer. The hardware accelerator employed as a case study in this work is the sum of absolute differences (SAD), which is the most compute-intensive accelerator on commercial video encoder for mobile applications. Our results demonstrate the runtime behavior impacts of three advanced block-matching algorithms of the video encoder in a joint operation by a SAD accelerator under timing-errors induced by temperature and aging effects considering a 14nm FinFET technology. Guilherme Paim, Hussam Amrouch, Leandro M. G. Rocha, Brunno Abreu, Eduardo A. C. da Costa, Sergio Bampi, Jörg Henkel |
IEEE Trans. Computers | 3 |
| 2020 | A Cross-Layer Gate-Level-to-Application Co-Simulation for Design Space Exploration of Approximate Circuits in HEVC Video EncodersabstractA cross-layer design space exploration (DSE) method based on a proposed co-simulation technique is presented herein. The proposed method is demonstrated evaluating the impacts on both coding efficiency and power dissipation of applying distinct approximate logic operators in a sum of absolute differences (SAD) kernel that accelerates an H.265/HEVC (high-efficiency video coding) encoder. The proposed method simulates the gate-level circuit dynamically inside the application, with realistic results of the impact of the adder-tree approximate logic implementation on both quality and encoder bit-rate results. A comprehensive DSE is shown herein, with 13 types of 6 classes of approximate adders in the SAD accelerator hardware blocks. Over 3,000 logic variants of approximations at gate-level were developed. Actual video sequences as inputs to the x265 software encoder are co-simulated, to dynamically capture the video motion-estimation (ME) behavior in the presence of logic approximations. While the prior art that only estimates the impact of the approximate logic on power, area, and quality on static designs with statistical assumptions, which are agnostic to the actual algorithm data-dependent behavior in the application, our method explores accurately the trade-off between power dissipation and coding efficiency dynamically over the entire HEVC encoding. Our approach shows that the lower-part-or and error-tolerant adder I approximate adders, as well as truncation-to-zero deliver better compression-power trade-offs, with substantial differences from the static analysis. Guilherme Paim, Leandro M. G. Rocha, Hussam Amrouch, Eduardo A. C. da Costa, Sergio Bampi, Jörg Henkel |
IEEE Trans. Circuits Syst. Video Technol. | 2 |
| 2019 | Maximizing Side Channel Attack-Resistance and Energy-Efficiency of the STTL Combining Multi-Vt Transistors with Current and Capacitance BalancingabstractSecure triple track logic (STTL) is a circuit-level countermeasure to differential power analysis (DPA) attacks based on dual-rail precharge logic (DPL). STTL is robust to attacks due to the delay insensitive topology characteristic that avoids the glitches generated by the different path delays, before the logic gate inputs stabilize. However, the main STTL drawbacks are the validation of timing-robustness and the unbalanced and asymmetric transistors arrangement that result in variable internal capacitances and different internal paths to the current flow behaviors. The main contribution of this work is a new STTL-based topology called MT-BSTTL that combines multi-threshold with a set of circuit balancing improvements on capacitance, current paths, and fan-in, aiming to maximize the energy-efficiency while still preserving the side-channel attack-resistance. Three basic logic gates were implemented using the proposed strategy and other secure transistor topologies, all using the TSMC 40 nm technology. Results show that MT-BSTTL outperforms all state-of-the-art logic styles in terms of robustness against DPA attacks. Comparing to the baseline STTL, the proposed MT-BSTTL is, at least, 50% faster, has 53.5% higher energy-efficient, and it is 44% more robust, incurring in a 40% circuit area penalty. Vitor G. Lima, Guilherme Paim, Leandro M. G. Rocha, Leomar S. da Rosa Jr., Felipe S. Marques 0001, Eduardo A. C. da Costa, Vinícius V. Camargo, Rafael Soares, Sergio Bampi |
ISCAS | 3 |