Demo Data from EDBT 2026 / reviewers in the wild / expert
Seung Hoon Choi
dblp:21/6132
· DBLP profile ↗
8ranked-venue papers
5as first author
0since 2021 · last 2010
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 6 · 4 first-authorSoftware engineering, systems software and programming languages · 1 · 1 first-authorDatabases, data management, data science and information retrieval · 1 · 1 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
4 papers |
Electronic design automation · 71% Performance modeling and evaluation · 16% Integrated circuit design · 13% |
Topics — the 12 heaviest of 12, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Performance modeling and evaluation
delay analysis |
0.1 | 1 | 2010 | Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation › timing analysis
static timing analysis |
0.1 | 1 | 2010 | Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation
timing analysis |
0.1 | 1 | 2010 | Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation
hardware verification and test |
0.1 | 2 | 2010 | Timed pattern generation for noise-on-delay calculation · DAC 2002 Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation
circuit sizing |
0.0 | 1 | 2004 | Novel sizing algorithm for yield improvement under process variation in nanometer technology · DAC 2004 |
Electronic design automation
physical design |
0.0 | 1 | 2004 | Novel sizing algorithm for yield improvement under process variation in nanometer technology · DAC 2004 |
Electronic design automation › timing analysis
statistical timing analysis |
0.0 | 1 | 2004 | Novel sizing algorithm for yield improvement under process variation in nanometer technology · DAC 2004 |
Integrated circuit design › interconnect
crosstalk noise |
0.0 | 1 | 2002 | Timed pattern generation for noise-on-delay calculation · DAC 2002 |
Electronic design automation
signal integrity |
0.0 | 1 | 2002 | Timed pattern generation for noise-on-delay calculation · DAC 2002 |
Electronic design automation › hardware verification and test
test generation |
0.0 | 1 | 2010 | Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 2000 | Dynamic noise analysis in precharge-evaluate circuits · DAC 2000 |
Integrated circuit design
low-power circuit design |
0.0 | 1 | 2000 | Dynamic noise analysis in precharge-evaluate circuits · DAC 2000 |
Methods — techniques the papers use, named apart from their topics
transistor-level simulation · 0.1input vector search · 0.1statistical timing analysis · 0.0sizing algorithm · 0.0aggressor alignment prediction · 0.0coupling capacitance analysis · 0.0HSPICE simulation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2010 | Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input SwitchingabstractIn multiple input switching (MIS) analysis, input signal alignment is one of the key factors which determines the quality and the accuracy of the approach. In this paper, we propose a new signal alignment methodology for MIS analysis based on a transistor level simulator at the core of the static timing analysis. Our proposed methodology searches through the possible input vectors in an efficient order to reduce the number of simulations and finds a true worst case signal alignment for both the MIN and the MAX analysis. In our 180 nm simulation setup, the worst-case delay is predicted within 0.5% error for more than 97% of test cases performing an average of less than two simulations per logic gate. Seung Hoon Choi, Kunhyuk Kang, Florentin Dartu, Kaushik Roy 0001 |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2004 | Novel sizing algorithm for yield improvement under process variation in nanometer technologyabstractDue to process parameter variations, a large variability in circuit delay occurs in scaled technologies affecting the yield. In this paper, we propose a sizing algorithm to ensure the speed of a circuit under process variation with a certain degree of confidence while maintaining the area and power budget within a limit. This algorithm estimates the variation in circuit delay using statistical timing analysis considering both inter- and intra-die process variation and resizes the circuit to achieve a desired yield. Experimental results on several benchmark circuits show that one can achieve up to 19% savings in area (power) using our algorithm compared to the worst-case design. Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy 0001 |
DAC | 1 |
| 2004 | Component Reconfiguration Tool for Software Product Lines with XML Technology
Seung Hoon Choi |
WISE | 1 |
| 2003 | A New Crosstalk Noise Model for DOMINO Logic Circuits
Seung Hoon Choi, Kaushik Roy 0001 |
DATE | 1 |
| 2002 | Timed pattern generation for noise-on-delay calculationabstractComputing the noise on delay effects is required for all circuits from simple ASIC designs to microprocessors. Transistor-level simulation engines make accurate delay calculation affordable only if the number of simulation per stage is very small. We propose a solution that predicts the alignment of aggressor signals with respect to the victim signal to induce the worst-case noise effect on delay. The aggressor alignment can be used to setup a detailed simulation. The worst-case delay in the presence of noise is predicted within 5% error for more than 99% of the cases tested using an average of 1.27 simulations per stage transition. Seung Hoon Choi, Kaushik Roy 0001, Florentin Dartu |
DAC | 1 |
| 2001 | Design Verification and Robust Design Technique for Cross-Talk FaultsabstractA recently proposed noise model to measure the dynamic noise immunity of high speed circuits is adopted to verify a design for cross-talk faults. We also define a qualitative measure of delay fault immunity of a circuit. Design of a precharge-evaluate circuit was verified using this model and a number of nodes, which are susceptible to cross-talk faults were identified. Finally, we propose a new array based layout architecture namely, O/sup 2/ABA (optimized overlaying array based architecture) to improve performance predictability of a circuit through cross talk reduction. A 4-bit full adder circuit was implemented using both standard cell design and O/sup 2/ABA. It is observed that the circuit implemented using O/sup 2/ABA is significantly less sensitive to delay faults than its standard cell design counterpart. Bipul Chandra Paul, Seung Hoon Choi, Yonghee Im, Kaushik Roy 0001 |
Asian Test Symposium | 2 |
| 2000 | Dynamic noise analysis in precharge-evaluate circuitsabstractA dynamic noise model is developed and applied to analyze the noise immunity of precharge-evaluate circuits. Considering that the primary source of noise-injection in the circuit is cross-talk, a simple metric represented as voltage-time product can be used to quantify the dynamic noise-margin. This is verified by HSPICE simulation on DOMINO gates. A tool is also developed to obtain static and dynamic noise-margins at various points in the circuit. Dynamic noise-margins are translated into maximum allowable coupling capacitances between the pairs of nets for precharge-evaluate logic circuits. An accurate estimate of dynamic noise-margin and coupling coefficient bounds will allow improvement of the circuits in terms of robustness. Dinesh Somasekhar, Seung Hoon Choi, Kaushik Roy 0001, Yibin Ye, Vivek De |
DAC | 2 |
| 2000 | Non-adaptive and adaptive filter implementation based on sharing multiplicationabstractFIR filtering can be expressed as multiplication of a vector by scalars. We present high-speed implementations for adaptive and nonadaptive filters based on a computation sharing multiplier which specifically targets computation re-use in vector-scalar products. The performance of the proposed implementation is compared with implementations based on carry save and Wallace tree multipliers in 0.6 /spl mu/ technology. We show that the sharing multiplier scheme improves speed by approximately 30% and 21% with respect to the Wallace tree multiplier based implementation for non-adaptive and adaptive filters, respectively. Jongsun Park 0001, Hunsoo Choo, Khurram Muhammad, Seung Hoon Choi, Yonghee Im, Kaushik Roy 0001 |
ICASSP | 4 |