Demo Data from EDBT 2026 / reviewers in the wild / expert
Niveditha Manjunath
dblp:217/3820
· DBLP profile ↗
5ranked-venue papers
1as first author
1since 2021 · last 2021
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 3 · 1 since 2021Systems, architecture and hardware · 1 · 1 first-authorTheory of computation · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Embedded and real-time systems · 100% | |
| Software engineering, system software, and programming languages
1 paper |
Software testing · 50% Program analysis · 50% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Embedded and real-time systems
cyber-physical systems |
0.4 | 1 | 2020 | CPSDebug: a tool for explanation of failures in cyber-physical systems · ISSTA 2020 |
Program analysis
specification mining |
0.1 | 1 | 2020 | CPSDebug: a tool for explanation of failures in cyber-physical systems · ISSTA 2020 |
Software testing
test generation |
0.1 | 1 | 2020 | CPSDebug: a tool for explanation of failures in cyber-physical systems · ISSTA 2020 |
Methods — techniques the papers use, named apart from their topics
specification mining · 0.9gray-box analysis · 0.9failure analysis · 0.9
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2021 | CPSDebug: Automatic failure explanation in CPS modelsabstractAbstract Debugging cyber-physical system (CPS) models is a cumbersome and costly activity. CPS models combine continuous and discrete dynamics—a fault in a physical component manifests itself in a very different way than a fault in a state machine. Furthermore, faults can propagate both in time and space before they can be detected at the observable interface of the model. As a consequence, explaining the reason of an observed failure is challenging and often requires domain-specific knowledge. In this paper, we propose approach, a novel CPSDebug that combines testing, specification mining, and failure analysis, to automatically explain failures in Simulink/Stateflow models. In particular, we address the hybrid nature of CPS models by using different methods to infer properties from continuous and discrete state variables of the model. We evaluate CPSDebug on two case studies, involving two main scenarios and several classes of faults, demonstrating the potential value of our approach. Ezio Bartocci, Niveditha Manjunath, Leonardo Mariani, Cristinel Mateis, Dejan Nickovic |
Int. J. Softw. Tools Technol. Transf. | 2 |
| 2020 | CPSDebug: a tool for explanation of failures in cyber-physical systemsabstractDebugging Cyber-Physical System models is often challenging, as it requires identifying a potentially long, complex and heterogenous combination of events that resulted in a violation of the expected behavior of the system. In this paper we present CPSDebug, a tool for supporting designers in the debugging of failures in MATLAB Simulink/Stateflow models. CPSDebug implements a gray-box approach that combines testing, specification mining, and failure analysis to identify the causes of failures and explain their propagation in time and space. The evaluation of the tool, based on multiple usage scenarios and faults and direct feedback from engineers, shows that CPSDebug can effectively aid engineers during debugging tasks. Ezio Bartocci, Niveditha Manjunath, Leonardo Mariani, Cristinel Mateis, Dejan Nickovic, Fabrizio Pastore |
ISSTA | 2 |
| 2019 | Automatic Failure Explanation in CPS Models
Ezio Bartocci, Niveditha Manjunath, Leonardo Mariani, Cristinel Mateis, Dejan Nickovic |
SEFM | 2 |
| 2018 | Localizing Faults in Simulink/Stateflow Models with STLabstractFault-localization is considered to be a very tedious and time-consuming activity in the design of complex Cyber-Physical Systems (CPS). This laborious task essentially requires expert knowledge of the system in order to discover the cause of the fault. In this context, we propose a new procedure that aids designers in debugging Simulink/Stateflow hybrid system models, guided by Signal Temporal Logic (STL) specifications. The proposed method relies on three main ingredients: (1) a monitoring and a trace diagnostics procedure that checks whether a tested behavior satisfies or violates an STL specification, localizes time segments and interfaces variables contributing to the property violations; (2) a slicing procedure that maps these observable behavior segments to the internal states and transitions of the Simulink model; and (3) a spectrum-based fault-localization method that combines the previous analysis from multiple tests to identify the internal states and/or transitions that are the most likely to explain the fault. We demonstrate the applicability of our approach on two Simulink models from the automotive and the avionics domain. Ezio Bartocci, Thomas Ferrère, Niveditha Manjunath, Dejan Nickovic |
HSCC | 3 |
| 2018 | Production Tests Coverage Analysis in the Simulation EnvironmentabstractIn the semiconductor industry, field returns have a negative impact with large costs and potential loss of reputation. As a consequence, a good coverage of the production tests with respect to the common manufacturing defects is essential to ensure the quality of the product to be delivered. Defect simulation is imperative to obtain coverage, however long simulation duration of the production tests can be a huge obstacle. Hence, there is an emergent need for novel methodologies to obtain coverage analysis of AMS chip production tests. In this paper, we address several aspects that are necessary to develop such a methodology. We first propose a method to identify a fault model that mimics the common manufacturing defects and extract all such faults from the DUT layout, we then develop a test ordering procedure that for a given fault selects the test from an existing test suite that is the most likely to detect the fault. The test ordering technique allows to avoid the execution of many tests during the coverage analysis and thus save considerable amounts of simulation time. We demonstrate the applicability and efficiency of the resulting techniques on an AMS design from Infineon Technologies AG. Niveditha Manjunath, Dieter Haerle, Stephen Sabanal, Herbert Eichinger, Hermann Tauber, Andreas Machne, Christian Manthey, Mikko Vaananen, Radu Grosu, Dejan Nickovic |
ITC | 1 |