Demo Data from EDBT 2026 / reviewers in the wild / expert
Marjan Ghodrati
dblp:221/2842
· DBLP profile ↗
2ranked-venue papers
1as first author
0since 2021 · last 2019
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-authorSecurity and privacy · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Network and information security
2 papers |
Hardware security and side channels · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Processor architecture and microarchitecture · 100% |
Topics — the 4 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware security and side channels
fault attacks |
0.7 | 2 | 2019 | A Secure Exception Mode for Fault-Attack-Resistant Processing · IEEE Trans. Dependable Secur. Comput. 2019 Inducing local timing fault through EM injection · DAC 2018 |
Hardware security and side channels
fault attack countermeasure |
0.4 | 1 | 2019 | A Secure Exception Mode for Fault-Attack-Resistant Processing · IEEE Trans. Dependable Secur. Comput. 2019 |
Hardware security and side channels › fault attacks › fault injection attack
electromagnetic fault injection |
0.3 | 1 | 2018 | Inducing local timing fault through EM injection · DAC 2018 |
Processor architecture and microarchitecture › instruction set architecture › RISC
RISC processor |
0.1 | 1 | 2018 | Inducing local timing fault through EM injection · DAC 2018 |
Methods — techniques the papers use, named apart from their topics
secure trap · 0.8hardware checkpointing · 0.8wire-level analysis · 0.7gate-level analysis · 0.7electromagnetic injection · 0.7
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | A Secure Exception Mode for Fault-Attack-Resistant ProcessingabstractFault attacks are a known threat to secure embedded implementations. We propose a generic technique to detect and react to fault attacks on embedded software. The countermeasure combines a micro-architecture extension in hardware with a secure trap in software. The combined extension leads to a secure exception mode to handle fault attacks. The microprocessor hardware uses a low-level hardware checkpointing mechanism to recover from fault injection. A high-level secure trap in software then enables an application-specific response. The trap is user-defined and can be co-developed with the application. The combination of hardware fault detection and recovery, with a high-level fault response policy in software leads to significantly lower overhead when compared to traditional redundancy-based techniques in hardware or software. We demonstrate a prototype implementation of the proposed secure exception mode. The prototype is based on a modified LEON3 processor and it is able to detect and respond to setup-time violation attacks. We have realized the design in a 180 nm standard cell ASIC with integrated memory. Using several driver application examples, we characterize the software and hardware overhead of the proposed solution, and we compare it to the conventional redundancy-based solutions. In our understanding this is the first proof-in-silicon processor to offer a comprehensive secure exception mode against fault-injection attacks. Bilgiday Yuce, Chinmay Deshpande, Marjan Ghodrati, Abhishek Bendre, Leyla Nazhandali, Patrick Schaumont |
IEEE Trans. Dependable Secur. Comput. | 3 |
| 2018 | Inducing local timing fault through EM injectionabstractElectromagnetic fault injection (EMFI) is an efficient class of physical attacks that can compromise the immunity of secure cryptographic algorithms. Despite successful EMFI attacks, the effects of electromagnetic injection (EM) on a processor are not well understood. This paper presents a bottom-up analysis of EMFI effects on a RISC microprocessor. We study these effects at three levels: at the wire-level, at the chip-network level, and at the gate-level considering parameters such as EM-injection location and timing. We conclude that EMFI induces local timing errors implying current timing attack detection and prevention techniques can be adapted to overcome EMFI. Marjan Ghodrati, Bilgiday Yuce, Surabhi Gujar, Chinmay Deshpande, Leyla Nazhandali, Patrick Schaumont |
DAC | 1 |