Calogero Ribellino

dblp:225/5616 · DBLP profile ↗
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4ranked-venue papers
0as first author
4since 2021 · last 2026
0009-0009-8862-9324ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 4 since 2021
YearPublicationVenuePosition
2026 Integrated Gate Driver with Adaptive Dead-Time Control and Gate-Drive Boost for High-Efficiency BCD Synchronous Buck Converters
abstract
An integrated BCD gate driver employing adaptive dead-time control (ADTC) and a compact gate-boost (GB) circuit is presented. The ADTC reduces both dead-time intervals from conventional$\sim 10 ~\text{ns}$to a nearly load-independent high-to-low dead time$\left(D T_{F}\right)$of$0.7-1.2 ~\text{ns}$over$1-6 ~\mathrm{A}$, and digitally minimizes low-to-high dead time ($D T_{R}$) to$\sim 1 ~\text{ns}$, lowering bodydiode conduction and reverse-recovery losses. At$38 ~\mathrm{V}, 6 ~\mathrm{A}$, and 2.2 MHz, this recovers a combined dead-time loss of up to 1.47 W, yielding an efficiency gain of 1.81 %. In addition, the open-loop GB circuit accelerates the later stage of the high-side transition, halving the$L X$rise time (28.4 ns to 14.5 ns) and yielding an additional 1.09 W loss reduction and 1.33 % efficiency gain. Overall, the proposed solution achieves a total loss reduction of 2.56 W and a 3.14 % absolute efficiency improvement.
Fahd Khan, Niccolo' Brambilla, Sandro Rossi, Calogero Ribellino, Edoardo Bonizzoni, Piero Malcovati
DDECS4
2026 A Compact and Efficient 40 V Capacitive Level Shifter With Feedback Discharge Control for Enhanced CMTI and Low FoM for Bootstrapped Gate Drivers in BCD Technology
abstract
A high-speed, low-figure-of-merit capacitive floating level shifter (CF-LS) for high-side bootstrapped gate drivers is presented. The design integrates a feedback discharge control (FBDC) for enhanced$V {_{\text {SW}}}$dV/dt (SRSW) immunity and combines a mismatch reduction circuit (MMRC) with a common-mode blanking pulse (CMBP) to block common-mode (CM) signals with mismatch. Fabricated in a 0.75-$\mu $m STMicroelectronics bipolar-CMOS-DMOS (BCD) process, the proposed CF-LS occupies 0.048 mm2with the core area being 0.026 mm2, making it highly compact and integration-friendly. It achieves a propagation delay ($T {_{\text {P}}}$) of 1.525 ns and transition energy ($E_{T}$) of 29.77 pJ at 40 V, both of which remain approximately constant across the$V {_{\text {SW}}}$sweep from 0 to 40 V, while maintaining measured SRSWimmunity of up to 20 V/ns and mismatch tolerance up to 30%. Compared to recent works, the design offers a$2\times $improvement in figure-of-merit2 (FoM2), achieving 2.68 ns$\cdot $pJ/$\mu $m${^{{3}}} \cdot $V at bootstrap supply ($V {_{\text {BS}}}$) of 5 V, and$3\times $improvement when supplied at 3.3 V. The CF-LS has been comprehensively validated both as a standalone circuit and when integrated within a dc–dc buck converter, making it a highly robust, efficient, and versatile solution for high-frequency power management systems operating up to 55 MHz.
Fahd Khan, Niccolo' Brambilla, Sandro Rossi, Calogero Ribellino, Stefano Corona, Edoardo Bonizzoni, Piero Malcovati
IEEE Trans. Very Large Scale Integr. Syst.4
2025 A 40V High-Speed Low-FoM Capacitive Level Shifter with Feedback Discharge Control for Floating Supply Gate Drivers on BCD Technology
abstract
A high-speed low-figure-of-merit capacitive-coupled level shifter tailored for high-side bootstrapped gate drivers is presented. Key techniques include a Feedback Discharge Control (FBDC) for improved dV/dt Immunity, a MisMatch Reduction Circuit (MMRC) in combination with Common-Mode Blanking Pulse (CMBP) to block common-mode signals with improved mismatch tolerance. The level shifter is fabricated in a 0.75µm STMicroelectronics BCD process and covers a chip area of 0.048mm2. Experimental results demonstrate a Propagation delay (TP) of 1.525ns and Transition Energy (ET) of 29.77pJ at 40V, with a dV/dt immunity of up to 20V/ns. The level shifter achieves a figure-of-merit 2 (FoM2) of 2.68ns.pJ/um3.V, an improvement of 2x from the recent literature, and exhibits a mismatch tolerance of 20%. The design has been tested at a switching frequency (FSW) of up to 55MHz. The design is validated through standalone and integrated testing in a DC-DC buck converter.
Fahd Khan, Niccolo' Brambilla, Sandro Rossi, Calogero Ribellino, Stefano Corona, Edoardo Bonizzoni, Piero Malcovati
ISCAS4
2025 46-nA High-PSR CMOS Buffered Voltage Reference With 1.2-5 V and -40 ◦C to 125 ◦C Operating Range
abstract
A nanopower, buffered CMOS voltage reference designed to operate across the entire industrial temperature range (from$- 40~^{\circ }$C to$125~^{\circ }$C) and with an input voltage range from 1.2 to 5 V (automotive applications) is presented. The solution provides 390 mV at$20~^{\circ }$C and is implemented in a standard BCD technology featuring 160-nm CMOS devices. It is characterized by an average temperature coefficient of 200 ppm/°C, a line sensitivity (LS) of 0.138%/V, and a power supply rejection of −83 dB at 100 Hz. In addition, the circuit occupies a die area of 0.146 mm2 (with the reference circuit alone covering 0.043 mm2) and maintains a highly stable current consumption of around 45 nA across various process and input voltage conditions (25 nA for the reference circuit alone) while providing a maximum output current of$630~\mu $A with a load regulation of 0.016 mV/$\mu $A.
Chiara Venezia, Andrea Ballo, Alfio Dario Grasso, Alessandro Rizzo 0002, Calogero Ribellino, Salvatore Pennisi
IEEE Trans. Very Large Scale Integr. Syst.5