Demo Data from EDBT 2026 / reviewers in the wild / expert
Younès Karkouri
dblp:24/3475
· DBLP profile ↗
2ranked-venue papers
1as first author
0since 2021 · last 1994
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
fault analysis |
0.0 | 1 | 1994 | Use of Fault Dropping for Multiple Fault Analysis · IEEE Trans. Computers 1994 |
Electronic design automation › hardware verification and test
fault collapsing |
0.0 | 1 | 1994 | Use of Fault Dropping for Multiple Fault Analysis · IEEE Trans. Computers 1994 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1994 | Use of Fault Dropping for Multiple Fault Analysis · IEEE Trans. Computers 1994 |
Electronic design automation › hardware verification and test › fault modeling
multiple stuck-at fault |
0.0 | 1 | 1994 | Use of Fault Dropping for Multiple Fault Analysis · IEEE Trans. Computers 1994 |
Methods — techniques the papers use, named apart from their topics
fault propagation · 0.0fault dropping · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1994 | Use of Fault Dropping for Multiple Fault AnalysisabstractA new approach to fault analysis is presented. The authors consider multiple stuck-at-0/1 faults at the gate level. First, a fault collapsing phase is applied to the network, so that equivalent faults are eliminated. During the analysis the authors consider frontier faults where there is at least a normal path from each faulty line to a primary output. It is shown that the set of frontier faults is equivalent to the set of multiple faults. Given an input vector, the authors evaluate the fault-free circuit and then propagate fault effects. Assuming that fault-free response is observed, a fault-dropping procedure is then applied to eliminate faulty conditions on lines, that are either absent or may be hidden by other faulty conditions. This method is applied to some benchmark circuits and achieves a high degree of efficiency.> Younès Karkouri, El Mostapha Aboulhamid, Eduard Cerny, Alain Verreault |
IEEE Trans. Computers | 1 |
| 1993 | On the generation of test patterns for multiple faults
El Mostapha Aboulhamid, Younès Karkouri, Eduard Cerny |
J. Electron. Test. | 2 |