Demo Data from EDBT 2026 / reviewers in the wild / expert
Stuart McCracken
dblp:24/956
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2002
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 91% Reconfigurable computing and FPGAs · 9% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › VLSI testing
FPGA interconnect testing |
0.0 | 1 | 2002 | FPGA test time reduction through a novel interconnect testing scheme · FPGA 2002 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 2002 | FPGA test time reduction through a novel interconnect testing scheme · FPGA 2002 |
Electronic design automation › hardware verification and test
test application time reduction |
0.0 | 1 | 2002 | FPGA test time reduction through a novel interconnect testing scheme · FPGA 2002 |
Reconfigurable computing and FPGAs
FPGA testing |
0.0 | 1 | 2002 | FPGA test time reduction through a novel interconnect testing scheme · FPGA 2002 |
Methods — techniques the papers use, named apart from their topics
feedback shift register · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2002 | FPGA test time reduction through a novel interconnect testing schemeabstractAs device densities increase, testing cost is becoming a larger portion of the overall FPGA manufacturing cost. We present an approach to speed up testing FPGA interconnect by reconfiguring it during the test. Simple additions are made to create feedback shift register structures, which considerably reduce the number of test configurations for the switching matrix interconnect. This new testing architecture reduces switching matrix test time by 66% and the diagnosis time by 72%. The additions are transparent to the users both in terms of speed and functionality. Stuart McCracken, Zeljko Zilic |
FPGA | 1 |