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Nitin Pundir
dblp:240/3338
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4ranked-venue papers
2as first author
4since 2021 · last 2023
0000-0001-5687-6237ORCID · verified
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 2 first-author · 4 since 2021
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2023 | SecHLS: Enabling Security Awareness in High-Level SynthesisabstractIn their quest for further optimization, High-level synthesis (HLS) utilizes advanced automatic optimization algorithms to achieve lower implementation time/effort for even more complex designs. These optimization algorithms are for the HLS tools' backend stages, e.g., allocation, scheduling, and binding, and they are highly optimized for resources/latency constraints. However, current HLS tools' backend is unaware of designs' security assets, and their algorithms are incapable of handling security constraints. In this paper, we propose Secure-HLS (SecHLS), which aims to define underlying security constraints for HLS tools' backend stages and intermediate representations. In SecHLS, we improve a set of widely-used scheduling and binding algorithms by integrating the proposed security-related constraints into them. We evaluate the effectiveness of SecHLS in terms of power, performance, area (PPA), security, and complexity (execution time) on small and real-size benchmarks, showing how the proposed security constraints can be integrated into HLS while maintaining low PPA/complexity burdens. Nitin Pundir, Hadi Mardani Kamali, Mark Tehranipoor, Farimah Farahmandi |
ASP-DAC | 2 |
| 2023 | Silicon-correlated Simulation Methodology of EM Side-channel Leakage AnalysisabstractCryptography hardware is vulnerable to side-channel (SC) attacks on power supply current flow and electromagnetic (EM) emission. This article proposes simulation-based power and EM side-channel leakage analysis (SCLA) techniques on a cryptographic integrated circuit (IC) chip in system level assembly. SCLA measures SC leakage metrics including T-score, SC leakage score, and the number of measurement traces to disclosure, leveraged by a secure system-on-chip design flow toward SC attack resiliency and SC leakage sign off. Power SCLA features the tracking of security sensitive registers within cryptographic logic paths and the automatic assignments of probe points on associated physical power nets. Power supply current traces are efficiently simulated for the large set of input payloads, with direct vector-based and vector-less random switching controls. EM SCLA evaluates magnetic fields created by every piece of metal wiring in metal stacks where power supply current of cryptographic processing flows. The EM emission and EM SCLA from the backside Si surface of an IC chip in flip-chip packaging are experimentally examined with a 0.13 μm test chip. The proposed simulation-based SCLA exhibits the SC leakage metrics of on-chip location and direction dependency as accurately as in the measurements. Kazuki Monta, Lang Lin, Jimin Wen, Harsh Shrivastav, Calvin Chow, Joao Geada, Sreeja Chowdhury, Nitin Pundir, Norman Chang, Makoto Nagata |
ACM J. Emerg. Technol. Comput. Syst. | 9 |
| 2022 | Analyzing Security Vulnerabilities Induced by High-level SynthesisabstractHigh-level synthesis (HLS) is essential to map the high-level language (HLL) description (e.g., in C/C++) of hardware design to the corresponding Register Transfer Level (RTL) to produce hardware-independent design specifications with reduced design complexity for ASICs and FPGAs. Adopting HLS is crucial for industrial and government applications to lower development costs, verification efforts, and time-to-market. Current research practices focus on optimizing HLS for performance, power, and area constraints. However, the literature does not include an analysis of the security implications carried through HLS-generated RTL translations (e.g., from an untimed high-level sequential specification to a fully scheduled implementation). This article demonstrates the evidence of security vulnerabilities that emerge during the HLS translation of a high-level description of system-on-chip (SoC) intellectual properties to their corresponding RTL. The evidence provided in this manuscript highlights the need for (a) guidelines for high-level programmers to prevent these security issues at the design time and (b) automated HLS verification solutions that cover security in their optimization flow. Nitin Pundir, Sohrab Aftabjahani, Rosario Cammarota, Mark Tehranipoor, Farimah Farahmandi |
ACM J. Emerg. Technol. Comput. Syst. | 1 |
| 2022 | Power Side-Channel Leakage Assessment Framework at Register-Transfer LevelabstractPower side-channel (PSC) attacks received significant attention over the past two decades due to their effectiveness in breaking mathematically strong cryptographic implementations. However, most existing PSC assessment frameworks apply only to post-silicon implementations; this is unfavorable to the industry due to the lack of flexibility in fixing the design and the high cost/time penalty incurred in redoing the entire design cycle. This article presents the register transfer level (RTL)-power analysis tool (PAT) framework to perform a technology-independent PSC assessment of cryptographic (pre- and post-quantum) hardware at the RTL stage. Performing assessment at the RTL gives designers the utmost flexibility to quickly apply the countermeasures locally. RTL-PAT can also serve as a front-end sign-off framework for PSC leakage, allowing a designer to make changes in the early design stage, which would otherwise be difficult/time-consuming to perform in subsequent design stages. Furthermore, RTL-PAT can analyze both FPGA and ASIC design flows for standalone IPs and SoCs. In this article, we present the efficacy of RTL-PAT on several cryptographic implementations. The results are presented for standalone IPs, which include different AES implementations (Galois field, lookup table, pipelined, and threshold implementation) andPRESENTcipher. We also analyze a large-scale SoC, which includes the post-quantum SABER implementation and AES. The results show that the framework effectively identifies the leaky modules and validates the efficacy of PSC countermeasures implemented in the RTL. The obtained RTL-PAT assessment results are validated with the post-silicon$t$-statistics assessment as well. Nitin Pundir, Jungmin Park, Farimah Farahmandi, Mark Tehranipoor |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |