Machine learning research, particularly in genomics, is often based on wide shaped datasets, i.e. datasets having a large number of features, but a small number of samples. Such configurations raise the possibility of chance influence (the increase of measured accuracy due to chance correlations) on the learning process and the evaluation results. Prior research underlined the problem of generalization of models obtained based on such data. In this paper, we investigate the influence of chance on prediction and show its significant effects on wide shaped datasets. First, we empirically demonstrate how significant the influence of chance in such datasets is by showing that prediction models trained on thousands of randomly generated datasets can achieve high accuracy. This is the case even when using cross-validation. We then provide a formal analysis of chance influence and design formal chance influence estimators based on the dataset parameters, namely its sample size, the number of features, the number of classes and the class distribution. Finally, we provide an in-depth discussion of the formal analysis including applications of the findings and recommendations on chance influence mitigation.

Recommender Systems are a well researched area and there are many approaches and algorithms solving different kind of problems. In TEL recommending appropriate learning resources is a common problem that cannot be generalized well due to different didactic strategies, educational needs and heterogeneous data sources. We therefore argue that a design science process is best suited to apply, combine and improve different established recommendation system approaches to TEL systems. In this paper, we report our architecture to support our design process and the lessons learned from our specific TEL use case. Finally, we conclude discussing the open problems, advantages of our architectural approach and directions for future research.

We motivate the need for, and describe the contents of a novel patent research collection, publicly available and for free, covering multimodal and multilingual data from six patent authorities. The new patent test collection complements existing patent test collections, which are vertical (one domain or one authority over many years). Instead, the new collection is horizontal: it includes all technical domains from the major patenting authorities over the relatively short time span of two years. In addition to bringing together documents currently scattered across different test collections, the collection provides, for the first time, Korean documents, to complement those from Europe, US, Japan, and China. This new collection can be used on a variety of tasks beyond traditional information retrieval. We exemplify this with a task of high-relevance today: de-anonymisation.