Demo Data from EDBT 2026 / reviewers in the wild / expert
Masunori Sugimoto
dblp:246/1532
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1986
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 77% Integrated circuit design · 23% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › CAD framework
design tool interoperability |
0.0 | 1 | 1986 | Standard Description Form for Device Characteristics in VLSI's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986 |
Methods — techniques the papers use, named apart from their topics
device simulation · 0.0circuit simulation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1986 | Standard Description Form for Device Characteristics in VLSI'sabstractA standard form is presented for describing device characteristics in VLSI's. It serves as a standard interchange form for device characteristics between various design tools for VLSI's. The form is designed such that any relevant characteristic as a circuit component can be described. It also makes it possible to process an enormous amount of device data efficiently. A newly developed CAD system, which integrates device and circuit simulators, is also presented as a standard form application example. Any device simulator, which has outputs in the standard form, can be implemented into the system. By using the standard form, various device simulators are able to be used in total LSI design systems, which makes it possible to execute accurate simulations and designs for LSI using recent fine pattern technologies. Masunori Sugimoto, Masao Fukuma |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |