Demo Data from EDBT 2026 / reviewers in the wild / expert
Ron Rose
dblp:25/2796
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2007
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 93% Integrated circuit design · 7% |
Topics — the 9 heaviest of 9, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › timing analysis
static timing analysis |
0.1 | 2 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 Harmony: static noise analysis of deep submicron digital integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Electronic design automation
hardware verification and test |
0.1 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › timing analysis
transistor-level timing analysis |
0.1 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 1999 | Harmony: static noise analysis of deep submicron digital integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Electronic design automation › hardware verification and test
hardware verification |
0.0 | 1 | 1999 | Harmony: static noise analysis of deep submicron digital integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Electronic design automation › hardware verification and test
static noise analysis |
0.0 | 1 | 1999 | Harmony: static noise analysis of deep submicron digital integrated circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Electronic design automation › physical verification
electrical rule checking |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation › physical design
parasitic extraction |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Electronic design automation
physical design |
0.0 | 1 | 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBM · Proc. IEEE 2007 |
Methods — techniques the papers use, named apart from their topics
transistor width tuning · 0.1static noise analysis · 0.1reduced-order modeling · 0.0interconnect macromodeling · 0.0hierarchical analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2007 | Transistor-Level Tools for High-End Processor Custom Circuit Design at IBMabstractIBM's high-performance microprocessor designs leverage internally developed electronic design automation tools to create high-frequency, power efficient, and robust microprocessors. This paper describes some of the tools employed in the custom circuit design methodology in IBM. The tools described include a transistor-level block-based static timer, a static noise analysis methodology, and a transistor width tuner that optimizes performance and area. We also describe the application of electrical rule checking used to enforce consistent design practices. Finally, we discuss a macro extraction tool that determines parasitic resistance and capacitance of interconnect from a layout. Karen Bard, Bill Dewey, Mei-Ting Hsu, Tom Mitchell 0003, Karl Moody, Vasant Rao, Ron Rose, Jeff Soreff, Steve Washburn |
Proc. IEEE | 7 |
| 1999 | Harmony: static noise analysis of deep submicron digital integrated circuitsabstractAs technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulation-based transistor-level analysis. We then describe Harmony, a two-level (macro and global) hierarchical implementation of static noise analysis. At the macro level, simplified interconnect models and timing assumptions guide efficient analysis. The global level involves a careful combination of static noise analysis, static timing analysis, and detailed interconnect macromodels based on reduced-order modeling techniques. We describe how the interconnect macromodels are practically employed to perform coupling analysis and how timing constraints can be used to limit pessimism in the analysis. Kenneth L. Shepard, Vinod Narayanan, Ron Rose |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |