EDBT 2026 Demo / reviewers in the wild / expert
Xingna Hou
dblp:251/7939
· DBLP profile ↗
8ranked-venue papers
1as first author
8since 2021 · last 2026
0000-0002-4299-3544ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 1 first-author · 4 since 2021Artificial intelligence and machine learning · 3 · 3 since 2021Security and privacy · 1 · 1 since 2021
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2026 | ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Function
Shouhong Chen, Lingfeng Han, Ziren Zhu, Xingna Hou |
J. Electron. Test. | 5 |
| 2025 | A lightweight Hardware Trojan detection approach in the waveform diagram based on MobileViT and attention mechanism
Shouhong Chen, Guanxiang Qin, Xingna Hou |
J. Supercomput. | 5 |
| 2024 | Mixed-type wafer defect detection based on multi-branch feature enhanced residual module
Shouhong Chen, Xingna Hou, Jun Ma 0031 |
Expert Syst. Appl. | 4 |
| 2024 | A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm
Xingna Hou, Guanxiang Qin, Mulan Yi, Shouhong Chen |
J. Electron. Test. | 1 |
| 2023 | Detection method of Golden Chip-Free Hardware Trojan based on the combination of ResNeXt structure and attention mechanism
Shouhong Chen, Xingna Hou |
Comput. Secur. | 4 |
| 2023 | Wafer map defect pattern detection method based on improved attention mechanism
Shouhong Chen, Meiqi Liu, Xingna Hou, Ziren Zhu |
Expert Syst. Appl. | 3 |
| 2023 | Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field
Shouhong Chen, Xingna Hou |
J. Electron. Test. | 4 |
| 2022 | Wafer map failure pattern recognition based on deep convolutional neural network
Shouhong Chen, Xingna Hou, Yuling Shang |
Expert Syst. Appl. | 3 |