Demo Data from EDBT 2026 / reviewers in the wild / expert
Clifford D. Maldonado
dblp:254/5963
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1990
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 77% Integrated circuit design · 23% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
process modeling |
0.0 | 1 | 1990 | A transient analytical model for predicting the redistribution of injected interstitials · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990 |
Methods — techniques the papers use, named apart from their topics
green's function · 0.0analytical modeling · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1990 | A transient analytical model for predicting the redistribution of injected interstitialsabstractA general formal transient solution to the linear boundary value problem which governs the transport of interstitials injected into an arbitrary bounded domain from oxidizing segments on the surface is presented. An explicit expression for the Green's function which appears as the kernel in the integral representation of the general transient solution is given for a simple domain of interest in the study of oxidation-enhanced diffusion (OED). By combining this explicit expression for the Green's function with the general formal solution, a transient analytical model for predicting the redistribution of interstitials injected into the simple domain from a single oxidizing segment is obtained. An illustrated example important to OED is considered and results obtained with the model and by approximations to the model are compared. Also, the results obtained with the SUPREM-IV program are presented for comparison.> Clifford D. Maldonado, Ross A. Williams |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |