Demo Data from EDBT 2026 / reviewers in the wild / expert
Robert A. Rasmussen
dblp:26/1528
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 1984
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.0 | 2 | 1984 | Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984 Delay test generation · DAC 1977 |
Electronic design automation › hardware verification and test
design for testability |
0.0 | 1 | 1984 | Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984 |
Electronic design automation
physical design |
0.0 | 1 | 1984 | Chip partitioning aid: A design technique for partitionability and testability in VLSI · DAC 1984 |
Electronic design automation › hardware verification and test › test generation › fault test generation
delay fault test generation |
0.0 | 1 | 1977 | Delay test generation · DAC 1977 |
Electronic design automation › hardware verification and test
test generation |
0.0 | 1 | 1977 | Delay test generation · DAC 1977 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1984 | Chip partitioning aid: A design technique for partitionability and testability in VLSI
Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Thomas W. Williams |
DAC | 3 |
| 1977 | Delay test generation
E. R. Hsieh, Robert A. Rasmussen, L. J. Vidunas, W. T. Davis |
DAC | 2 |