This paper presents an area-efficient 0.8 V current-mode bandgap reference (BGR) in 22nm fully-depleted silicon-on-insulator (FD-SOI) CMOS process. Implementing the body bias technique allows for smaller device sizes while maintaining high performance across process, voltage, and temperature variations. A regulated cascode structure further minimizes the reference voltage variation. Post-layout simulations show a temperature coefficient (TC) of 34.6 ppm/oC between -40oC and 125oC while consuming 0.82 mW of power from a 1.8 V supply voltage. The proposed BGR demonstrates a power supply rejection ratio (PSRR) below -53.9 dB over the full frequency range and a noise spectral density of $16.5\mu {\text{V}}/\sqrt {Hz} $ at 10 Hz. The BGR is integrated with a low-dropout (LDO) voltage regulator, which combined have a chip area of 0.008316 mm2, offering reduced size compared to the present state-of-the-art untrimmed BGRs.

Most researchers conduct wireless networking experiments in their laboratory or similar indoor environments. Such environments are veritable RF jungles, especially when we consider the ISM bands. In this paper we examine and test several common explicit and implicit assumptions that researchers tend to make about the wireless environment. Although these assumptions are acknowledged by most researchers, the extent of their impact is often underestimated. We find that because the environment is always in flux, it is almost impossible to reproduce the results of an experiment. Hence, there is a high risk of misinterpreting the data obtained from such experiments. Through this paper we try to caution experimenters against such risky assumptions when they venture into the RF jungle. After a successful proof-of-concept experiment, we advocate the use of wireless networking testbeds that provide experimenters better control over the RF environment by using coaxial cables, programmable attenuators and power dividers/combiners.

Software simulation has often been used to evaluate proposed protocols for wireless devices. Simulation allows for rapid development and testing, but does not provide a realistic RF environment. To compensate for this, field experiments are performed. However, problems encountered during field experiments can be difficult to locate and correcting problems on-site can be time-consuming. Emulations attempt to provide the advantages of simulation and field experiments without the suffering the disadvantages of both. This demo provides an overview of the hardware, software, and emulation capabilities of ASSERT, an emulation testbed.