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Mohammed Al-Mulla

dblp:26/7621 · DBLP profile ↗
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4ranked-venue papers
0as first author
0since 2021 · last 2011
0000-0003-1165-7852ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2Applied, interdisciplinary, general and emerging computing · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.112011
Enhancing encoding capacity of combinational test stimulus decompressors · Sci. China Inf. Sci. 2011
Electronic design automation › hardware verification and test
combinational circuit testing
0.012011
Enhancing encoding capacity of combinational test stimulus decompressors · Sci. China Inf. Sci. 2011

Methods — techniques the papers use, named apart from their topics

encoding · 0.1decompressor design · 0.1
YearPublicationVenuePosition
2011 Enhancing encoding capacity of combinational test stimulus decompressors
Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla
Sci. China Inf. Sci.3
2010 Pattern Encodability Enhancements for Test Stimulus Decompressors
abstract
While scan-based compression is widely utilized in order to alleviate the test time and data volume problems, the overall compression level is dictated not only by the chain to channel ratio but also the ratio of encodable patterns. Aggressively increasing the number of scan chains in an effort to raise the compression levels may reduce the ratio of encodable patterns, degrading the overall compression level. In this paper, we present various methods to improve the ratio of encodable patterns. These methods are based on manipulating the care bit distribution of an unencodable pattern, thereby rendering it compliant with the correlation induced by the decompressor, and thus converting it into an encodable pattern. The proposed methods target improvements over fan-out and XOR decompressors, while they can be utilized to enhance other types of decompressors, such as multiplexer-based ones. Care bit manipulation is effected in the form of selective chain delay, selective slice rotate/invert, or both. By developing computationally efficient algorithms and cost-effective hardware blocks for these manipulation methods, we show that the encodability, and thus the compression levels, of stimulus decompressors can be significantly improved through the proposed practical and design flow compatible solution.
Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla
Asian Test Symposium3
2010 Add-on blocks and algorithms for improving stimulus compression
abstract
Scan architecture with compression support has been a de-facto solution in recent designs. It has been shown that compression levels and the quality attained highly depend on the ratio of encodable test patterns. We observe that whether a test pattern is encodable by a decompressor is a direct consequence of whether its care bit distribution is compatible with the correlation induced by the decompressor. Therefore, we present a series of “add-on” blocks that can be utilized to control the care bit distribution and thus to improve the encodability of stimulus decompressors. We show that compression levels attained by fan-out and XOR decompressors can be significantly enhanced via the proposed add-on blocks and the supporting algorithms.
Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla
ETS3
2009 Scan Cell Positioning for Boosting the Compression of Fan-Out Networks
Ozgur Sinanoglu, Mohammed Al-Mulla, Noora A. Shunaiber, Alex Orailoglu
J. Comput. Sci. Technol.2