Demo Data from EDBT 2026 / reviewers in the wild / expert
Asutosh Srivastava
dblp:269/9476
· DBLP profile ↗
2ranked-venue papers
0as first author
2since 2021 · last 2026
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
formal verification |
0.7 | 1 | 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision Diagrams · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023 |
Electronic design automation
hardware verification and test |
0.7 | 1 | 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision Diagrams · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023 |
Electronic design automation › hardware verification and test › formal verification
multiplier verification |
0.7 | 1 | 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision Diagrams · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023 |
Electronic design automation › logic synthesis › decision diagrams
binary decision diagram |
0.2 | 1 | 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision Diagrams · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023 |
Electronic design automation › hardware verification and test › formal verification
equivalence checking |
0.2 | 1 | 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision Diagrams · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023 |
Methods — techniques the papers use, named apart from their topics
binary decision diagram · 0.7additional variable method · 0.7SAT · 0.7
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2026 | A comparative study on formal verification techniques to verify large integer multiplier circuits
Asutosh Srivastava, Masahiro Fujita 0004 |
Integr. | 2 |
| 2023 | Formal Verification of Integer Multiplier Circuits Using Binary Decision DiagramsabstractMultiplier circuit covers a more extensive area of embedded system application in digital signal processing, cryptography, and multimedia. Nonstandard implementations and custom optimization are being done to reduce the size of multipliers. The circuit became prone to a buggy, and hence the demand for verification increased. Formal verification methods, such as satisfiability (SAT), symbolic computer algebra (SCA), and binary decision diagrams (BDDs) have made massive progress over the last few decades. However, these methods are insufficient to verify the optimized multipliers. SAT-based equivalence checking is computationally expensive. SCA-based backward rewriting is limited to algebraic-friendly multipliers. The complexity of BDDs is exponential with the input size. Although, by allowing an additional variable method, the size of the BDD is limited to 4th degree polynomial of the number of the inputs, this method is not explored to verify optimized multipliers. This article focus on verifying integer multipliers with diverse architectures. We propose an algorithm for the direct construction of BDDs without traversing circuits and generate BDDs up to 1024 bits. We utilize the additional variable method and constructing BDDs using high-to-low variable ordering. We reduce the complexity of BDD size to a 3rd degree polynomial. We generate BDDs and verify the multipliers with various architectures up to 64 bits. We propose a method to verify optimized multipliers by checking equivalence and verifying up to 32-bits optimized multipliers. We do the error tolerance analysis of our approach by inserting bugs in a circuit at various locations. Yukio Miyasaka, Asutosh Srivastava, Masahiro Fujita 0004 |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 3 |