Demo Data from EDBT 2026 / reviewers in the wild / expert
Mary R. Feay
dblp:271/2468
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1982
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Computer networks · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software maintenance and evolution · 62% Software testing · 19% Debugging and program repair · 19% |
Topics — the 2 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Debugging and program repair
debugging tools |
0.0 | 1 | 1982 | A Software Development System for Reliable Applications · IEEE Trans. Commun. 1982 |
Software testing
software testing tools |
0.0 | 1 | 1982 | A Software Development System for Reliable Applications · IEEE Trans. Commun. 1982 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1982 | A Software Development System for Reliable ApplicationsabstractThis paper describes a Software Development System (SDS) that was implemented at Bell Laboratories to support the development of software for Electronic Switching Systems (ESS). The SDS supports multiple programmers and multiple releases. It permits incremental development in a timely and efficient manner while maintaining project management control and tracking capabilities. Software testing and debugging tools are also provided. The SDS was implemented and is currently being used to support the development and maintenance of software used in the No. 2B and No. 3 ESS manufactured by Western Electric for the Bell System. There are approximately 500 of these systems currently serving telephone subscribers. This paper describes the SDS implementation for the No. 2B ESS, and discusses some of the user and project experiences. Patrick E. White, Mary R. Feay |
IEEE Trans. Commun. | 2 |