Test application to state-of-the-art integrated circuits usually consists of multiple test insertions: wafer sort, final test and system-level test (SLT). This paper considers optimization of test content, taking requirements of specific scenarios, such as expected yield levels, test costs and criticality of test escapes, into account. An integrated cost model is proposed and applied to four different test setups on a medium-complexity RISC-V microprocessor. Our results indicate opportunities for up to ~ 40% total cost reduction compared to today’s industrial practice. They also provide insights on the relative importance of various cost contributors, such as the number of available scan test insertions or the specific SLT workload used.

With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks.

Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.

RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.

System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.